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Following the propagation of erroneous x-ray photoelectron spectroscopy peak fitting through the literature. A genealogical approach.

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Title: Following the propagation of erroneous x-ray photoelectron spectroscopy peak fitting through the literature. A genealogical approach.
Authors: Clark, B. Maxwell1 (AUTHOR), Major, George H.2 (AUTHOR), Pinder, Joshua W.1 (AUTHOR), Austin, Daniel E.1 (AUTHOR), Baer, Donald R.3 (AUTHOR), Biesinger, Mark C.4 (AUTHOR), Easton, Christopher D.5 (AUTHOR), Harmer, Sarah L.6 (AUTHOR), Herrera-Gomez, Alberto7 (AUTHOR), Hughes, Anthony E.8 (AUTHOR), Skinner, William M.9 (AUTHOR), Linford, Matthew R.1 (AUTHOR)
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films. Dec2024, Vol. 42 Issue 6, p1-7. 7p.
Subjects: X-ray photoelectron spectroscopy, Scientific literature, Grandparents
Abstract: This study considers how poor x-ray photoelectron spectroscopy (XPS) peak fitting in the scientific literature is both affected by previous precedent and affects future published work. It focuses on a highly cited paper (the "Subject" paper) from a respected journal that contains incorrect S 2p peak fits. This paper was studied in a genealogical fashion vis-à-vis the XPS peak fitting in its "child," "parent," "grandparent," and "great-grandparent" papers. Interestingly, precedents were not followed to a high degree between parent and child papers. However, in many cases, even when the authors of a study did not follow the incorrect precedent that they cited, they still incorrectly fit their data. Thus, not necessarily for good reasons, the effects of poor XPS peak fits on future generations of papers may be less than some experts had expected or feared. In many cases, older papers appear to contain better XPS peak fitting than newer ones. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
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DbLabel: Engineering Source
An: 181207976
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Following the propagation of erroneous x-ray photoelectron spectroscopy peak fitting through the literature. A genealogical approach.
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  Data: <searchLink fieldCode="AR" term="%22Clark%2C+B%2E+Maxwell%22">Clark, B. Maxwell</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Major%2C+George+H%2E%22">Major, George H.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pinder%2C+Joshua+W%2E%22">Pinder, Joshua W.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Austin%2C+Daniel+E%2E%22">Austin, Daniel E.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Baer%2C+Donald+R%2E%22">Baer, Donald R.</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Biesinger%2C+Mark+C%2E%22">Biesinger, Mark C.</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Easton%2C+Christopher+D%2E%22">Easton, Christopher D.</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Harmer%2C+Sarah+L%2E%22">Harmer, Sarah L.</searchLink><relatesTo>6</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Herrera-Gomez%2C+Alberto%22">Herrera-Gomez, Alberto</searchLink><relatesTo>7</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Hughes%2C+Anthony+E%2E%22">Hughes, Anthony E.</searchLink><relatesTo>8</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Skinner%2C+William+M%2E%22">Skinner, William M.</searchLink><relatesTo>9</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Linford%2C+Matthew+R%2E%22">Linford, Matthew R.</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="DE" term="%22X-ray+photoelectron+spectroscopy%22">X-ray photoelectron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Scientific+literature%22">Scientific literature</searchLink><br /><searchLink fieldCode="DE" term="%22Grandparents%22">Grandparents</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: This study considers how poor x-ray photoelectron spectroscopy (XPS) peak fitting in the scientific literature is both affected by previous precedent and affects future published work. It focuses on a highly cited paper (the "Subject" paper) from a respected journal that contains incorrect S 2p peak fits. This paper was studied in a genealogical fashion vis-à-vis the XPS peak fitting in its "child," "parent," "grandparent," and "great-grandparent" papers. Interestingly, precedents were not followed to a high degree between parent and child papers. However, in many cases, even when the authors of a study did not follow the incorrect precedent that they cited, they still incorrectly fit their data. Thus, not necessarily for good reasons, the effects of poor XPS peak fits on future generations of papers may be less than some experts had expected or feared. In many cases, older papers appear to contain better XPS peak fitting than newer ones. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=181207976
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        Value: 10.1116/6.0004093
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        Text: English
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      – SubjectFull: Scientific literature
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              Text: Dec2024
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