Rahman, M. A., Ang, L., Sun, Y., & Seng, K. P. (2025). A deep embedded clustering technique using dip test and unique neighbourhood set. Neural Computing & Applications, 37(3), 1345. https://doi.org/10.1007/s00521-024-10497-4
Chicago Style (17th ed.) CitationRahman, Md Anisur, Li-minn Ang, Yuan Sun, and Kah Phooi Seng. "A Deep Embedded Clustering Technique Using Dip Test and Unique Neighbourhood Set." Neural Computing & Applications 37, no. 3 (2025): 1345. https://doi.org/10.1007/s00521-024-10497-4.
MLA (9th ed.) CitationRahman, Md Anisur, et al. "A Deep Embedded Clustering Technique Using Dip Test and Unique Neighbourhood Set." Neural Computing & Applications, vol. 37, no. 3, 2025, p. 1345, https://doi.org/10.1007/s00521-024-10497-4.
Warning: These citations may not always be 100% accurate.