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Development of MHz X‐ray phase contrast imaging at the European XFEL.

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Title: Development of MHz X‐ray phase contrast imaging at the European XFEL.
Authors: Koliyadu, Jayanath C. P.1 (AUTHOR), Moško, Daniel2 (AUTHOR), Asimakopoulou, Eleni Myrto3 (AUTHOR), Bellucci, Valerio1 (AUTHOR), Birnšteinová, Šarlota1 (AUTHOR), Bean, Richard1 (AUTHOR), Letrun, Romain1 (AUTHOR), Kim, Chan1 (AUTHOR), Kirkwood, Henry1 (AUTHOR), Giovanetti, Gabriele1 (AUTHOR), Jardon, Nerea1 (AUTHOR), Szuba, Janusz1 (AUTHOR), Guest, Trey1,4 (AUTHOR), Koch, Andreas1 (AUTHOR), Grünert, Jan1 (AUTHOR), Szeles, Peter2 (AUTHOR), Villanueva-Perez, Pablo3 (AUTHOR), Reuter, Fabian5 (AUTHOR), Ohl, Claus-Dieter5 (AUTHOR), Noack, Mike Andreas6 (AUTHOR)
Source: Journal of Synchrotron Radiation. Jan2025, Vol. 32 Issue 1, p17-28. 12p.
Subjects: Phase-contrast microscopy, Spatial resolution, Scintillators, Detectors, Optical microscopes, Microscopes
Abstract: We report on recent developments that enable megahertz hard X‐ray phase contrast imaging (MHz XPCI) experiments at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of the European XFEL facility (EuXFEL). We describe the technical implementation of the key components, including an MHz fast camera and a modular indirect X‐ray microscope system based on fast scintillators coupled through a high‐resolution optical microscope, which enable full‐field X‐ray microscopy with phase contrast of fast and irreversible phenomena. The image quality for MHz XPCI data showed significant improvement compared with a pilot demonstration of the technique using parallel beam illumination, which also allows access to up to 24 keV photon energies at the SPB/SFX instrument of the EuXFEL. With these developments, MHz XPCI was implemented as a new method offered for a broad user community (academic and industrial) and is accessible via standard user proposals. Furthermore, intra‐train pulse diagnostics with a high few‐micrometre spatial resolution and recording up to 128 images of consecutive pulses in a train at up to 1.1 MHz repetition rate is available upstream of the instrument. Together with the diagnostic camera upstream of the instrument and the MHz XPCI setup at the SPB/SFX instrument, simultaneous two‐plane measurements for future beam studies and feedback for machine parameter tuning are now possible. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Development of MHz X‐ray phase contrast imaging at the European XFEL.
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  Data: <searchLink fieldCode="AR" term="%22Koliyadu%2C+Jayanath+C%2E+P%2E%22">Koliyadu, Jayanath C. P.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Moško%2C+Daniel%22">Moško, Daniel</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Asimakopoulou%2C+Eleni+Myrto%22">Asimakopoulou, Eleni Myrto</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Bellucci%2C+Valerio%22">Bellucci, Valerio</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Birnšteinová%2C+Šarlota%22">Birnšteinová, Šarlota</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Bean%2C+Richard%22">Bean, Richard</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Letrun%2C+Romain%22">Letrun, Romain</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kim%2C+Chan%22">Kim, Chan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kirkwood%2C+Henry%22">Kirkwood, Henry</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Giovanetti%2C+Gabriele%22">Giovanetti, Gabriele</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jardon%2C+Nerea%22">Jardon, Nerea</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Szuba%2C+Janusz%22">Szuba, Janusz</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Guest%2C+Trey%22">Guest, Trey</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Koch%2C+Andreas%22">Koch, Andreas</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Grünert%2C+Jan%22">Grünert, Jan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Szeles%2C+Peter%22">Szeles, Peter</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Villanueva-Perez%2C+Pablo%22">Villanueva-Perez, Pablo</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Reuter%2C+Fabian%22">Reuter, Fabian</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ohl%2C+Claus-Dieter%22">Ohl, Claus-Dieter</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Noack%2C+Mike+Andreas%22">Noack, Mike Andreas</searchLink><relatesTo>6</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. Jan2025, Vol. 32 Issue 1, p17-28. 12p.
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  Data: <searchLink fieldCode="DE" term="%22Phase-contrast+microscopy%22">Phase-contrast microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Spatial+resolution%22">Spatial resolution</searchLink><br /><searchLink fieldCode="DE" term="%22Scintillators%22">Scintillators</searchLink><br /><searchLink fieldCode="DE" term="%22Detectors%22">Detectors</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+microscopes%22">Optical microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Microscopes%22">Microscopes</searchLink>
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  Data: We report on recent developments that enable megahertz hard X‐ray phase contrast imaging (MHz XPCI) experiments at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of the European XFEL facility (EuXFEL). We describe the technical implementation of the key components, including an MHz fast camera and a modular indirect X‐ray microscope system based on fast scintillators coupled through a high‐resolution optical microscope, which enable full‐field X‐ray microscopy with phase contrast of fast and irreversible phenomena. The image quality for MHz XPCI data showed significant improvement compared with a pilot demonstration of the technique using parallel beam illumination, which also allows access to up to 24 keV photon energies at the SPB/SFX instrument of the EuXFEL. With these developments, MHz XPCI was implemented as a new method offered for a broad user community (academic and industrial) and is accessible via standard user proposals. Furthermore, intra‐train pulse diagnostics with a high few‐micrometre spatial resolution and recording up to 128 images of consecutive pulses in a train at up to 1.1 MHz repetition rate is available upstream of the instrument. Together with the diagnostic camera upstream of the instrument and the MHz XPCI setup at the SPB/SFX instrument, simultaneous two‐plane measurements for future beam studies and feedback for machine parameter tuning are now possible. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
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  Data: <i>Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1107/S160057752400986X
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        Text: English
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