APA (7th ed.) Citation

Higashida, K., Sadamatsu, S., & Tanaka, M. (2025). High‐voltage electron microscopy analyses for crack‐tip dislocations and their shielding effect on fracture toughness in MgO and Si crystals. Journal of the American Ceramic Society, 108(6), 1. https://doi.org/10.1111/jace.20378

Chicago Style (17th ed.) Citation

Higashida, Kenji, Sunao Sadamatsu, and Masaki Tanaka. "High‐voltage Electron Microscopy Analyses for Crack‐tip Dislocations and Their Shielding Effect on Fracture Toughness in MgO and Si Crystals." Journal of the American Ceramic Society 108, no. 6 (2025): 1. https://doi.org/10.1111/jace.20378.

MLA (9th ed.) Citation

Higashida, Kenji, et al. "High‐voltage Electron Microscopy Analyses for Crack‐tip Dislocations and Their Shielding Effect on Fracture Toughness in MgO and Si Crystals." Journal of the American Ceramic Society, vol. 108, no. 6, 2025, p. 1, https://doi.org/10.1111/jace.20378.