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Enhanced Imaging in Scanning Transmission X-Ray Microscopy Assisted by Ptychography.

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Title: Enhanced Imaging in Scanning Transmission X-Ray Microscopy Assisted by Ptychography.
Authors: Wu, Shuhan1,2,3 (AUTHOR), Xu, Zijian1,2,3 (AUTHOR), Li, Ruoru1,2,3,4 (AUTHOR), Chen, Sheng1,2,3,4 (AUTHOR), Zhang, Yingling1,2,3 (AUTHOR), Zhang, Xiangzhi1,2,3 (AUTHOR), Chen, Zhenhua1,2,3 (AUTHOR), Tai, Renzhong1,2,3,4 (AUTHOR)
Source: Nanomaterials (2079-4991). Apr2025, Vol. 15 Issue 7, p496. 18p.
Subjects: Image reconstruction, X-ray microscopy, X-ray imaging, Image intensifiers, Image transmission
Abstract: Scanning transmission X-ray microscopy (STXM) is a direct imaging technique with nanoscale resolution. But its resolution is limited by the spot size on the sample, i.e., by the manufacturing technique of the focusing element. As an emerging high-resolution X-ray imaging technique, ptychography utilizes highly redundant data from overlapping scans as well as phase retrieval algorithms to simultaneously reconstruct a high-resolution sample image and a probe function. In this study, we designed an accurate reconstruction strategy to obtain the probe spot with the vibration effects being eliminated, and developed an image enhancement technique for STXM by combining the reconstructed probe with the deconvolution algorithm. This approach significantly improves the resolution of STXM imaging and can break the limitation of the focal spot on STXM resolution when the scanning step size is near or below the spot size, while the data processing time is much shorter than that of ptychography. Both simulations and experiments show that this approach can be applied to STXM data at different energies and different scan steps using the same focal spot retrieved via ptychography. [ABSTRACT FROM AUTHOR]
Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Enhanced Imaging in Scanning Transmission X-Ray Microscopy Assisted by Ptychography.
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  Data: <searchLink fieldCode="AR" term="%22Wu%2C+Shuhan%22">Wu, Shuhan</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Xu%2C+Zijian%22">Xu, Zijian</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Li%2C+Ruoru%22">Li, Ruoru</searchLink><relatesTo>1,2,3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Sheng%22">Chen, Sheng</searchLink><relatesTo>1,2,3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Yingling%22">Zhang, Yingling</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Xiangzhi%22">Zhang, Xiangzhi</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Zhenhua%22">Chen, Zhenhua</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tai%2C+Renzhong%22">Tai, Renzhong</searchLink><relatesTo>1,2,3,4</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Nanomaterials+%282079-4991%29%22">Nanomaterials (2079-4991)</searchLink>. Apr2025, Vol. 15 Issue 7, p496. 18p.
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  Data: <searchLink fieldCode="DE" term="%22Image+reconstruction%22">Image reconstruction</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+microscopy%22">X-ray microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+imaging%22">X-ray imaging</searchLink><br /><searchLink fieldCode="DE" term="%22Image+intensifiers%22">Image intensifiers</searchLink><br /><searchLink fieldCode="DE" term="%22Image+transmission%22">Image transmission</searchLink>
– Name: Abstract
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  Data: Scanning transmission X-ray microscopy (STXM) is a direct imaging technique with nanoscale resolution. But its resolution is limited by the spot size on the sample, i.e., by the manufacturing technique of the focusing element. As an emerging high-resolution X-ray imaging technique, ptychography utilizes highly redundant data from overlapping scans as well as phase retrieval algorithms to simultaneously reconstruct a high-resolution sample image and a probe function. In this study, we designed an accurate reconstruction strategy to obtain the probe spot with the vibration effects being eliminated, and developed an image enhancement technique for STXM by combining the reconstructed probe with the deconvolution algorithm. This approach significantly improves the resolution of STXM imaging and can break the limitation of the focal spot on STXM resolution when the scanning step size is near or below the spot size, while the data processing time is much shorter than that of ptychography. Both simulations and experiments show that this approach can be applied to STXM data at different energies and different scan steps using the same focal spot retrieved via ptychography. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.3390/nano15070496
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        Text: English
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        PageCount: 18
        StartPage: 496
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      – SubjectFull: Image reconstruction
        Type: general
      – SubjectFull: X-ray microscopy
        Type: general
      – SubjectFull: X-ray imaging
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      – SubjectFull: Image intensifiers
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      – SubjectFull: Image transmission
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      – TitleFull: Enhanced Imaging in Scanning Transmission X-Ray Microscopy Assisted by Ptychography.
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            NameFull: Wu, Shuhan
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            NameFull: Xu, Zijian
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            NameFull: Li, Ruoru
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            NameFull: Zhang, Yingling
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            NameFull: Zhang, Xiangzhi
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            NameFull: Chen, Zhenhua
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              M: 04
              Text: Apr2025
              Type: published
              Y: 2025
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