X-ray compositional microanalysis and X-ray diffraction of Haltern 70 amphorae sherds.

Saved in:
Bibliographic Details
Title: X-ray compositional microanalysis and X-ray diffraction of Haltern 70 amphorae sherds.
Authors: Pinheiro, Daniel1 (AUTHOR), Guerra, Mauro1 (AUTHOR), Silva, António J. M.2 (AUTHOR), Stieghorst, Christian3 (AUTHOR), Costa, Benilde F. O.4 (AUTHOR) benilde@uc.pt
Source: Applied Physics A: Materials Science & Processing. Apr2025, Vol. 131 Issue 4, p1-11. 11p.
Subjects: X-ray microanalysis, X-ray fluorescence, Principal components analysis, Fluorescence spectroscopy, X-ray diffraction
Abstract: About 100 sherds from Haltern 70 amphorae recovered from Castro do Vieito (NW Portugal) and from kiln sites located at Guadalquivir valley, Rio Tinto valley, bay of Cadix and Algarve coast, were analyzed by X-ray fluorescence spectroscopy (XRF) and X-ray diffraction (XRD). The study aimed mainly to verify the provenance of Castro do Vieito (CV) Haltern 70 amphorae. Principal components analysis (PCA) and cluster analysis (CA) were performed. A CV sherd with a potter's stamp "LH..." was studied among other CV sherds and it was found that they have the same origin, and probably a unique provenance. The most considered area of Haltern 70 type, Guadalquivir valley, is not likely to be the origin of CV Haltern 70 amphorae. Moreover, it is quite possible that these amphorae were produced in a region with Nb rich soils. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: egs
DbLabel: Engineering Source
An: 184556119
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: X-ray compositional microanalysis and X-ray diffraction of Haltern 70 amphorae sherds.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Pinheiro%2C+Daniel%22">Pinheiro, Daniel</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Guerra%2C+Mauro%22">Guerra, Mauro</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Silva%2C+António+J%2E+M%2E%22">Silva, António J. M.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Stieghorst%2C+Christian%22">Stieghorst, Christian</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Costa%2C+Benilde+F%2E+O%2E%22">Costa, Benilde F. O.</searchLink><relatesTo>4</relatesTo> (AUTHOR)<i> benilde@uc.pt</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+A%3A+Materials+Science+%26+Processing%22">Applied Physics A: Materials Science & Processing</searchLink>. Apr2025, Vol. 131 Issue 4, p1-11. 11p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22X-ray+microanalysis%22">X-ray microanalysis</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+fluorescence%22">X-ray fluorescence</searchLink><br /><searchLink fieldCode="DE" term="%22Principal+components+analysis%22">Principal components analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Fluorescence+spectroscopy%22">Fluorescence spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: About 100 sherds from Haltern 70 amphorae recovered from Castro do Vieito (NW Portugal) and from kiln sites located at Guadalquivir valley, Rio Tinto valley, bay of Cadix and Algarve coast, were analyzed by X-ray fluorescence spectroscopy (XRF) and X-ray diffraction (XRD). The study aimed mainly to verify the provenance of Castro do Vieito (CV) Haltern 70 amphorae. Principal components analysis (PCA) and cluster analysis (CA) were performed. A CV sherd with a potter's stamp "LH..." was studied among other CV sherds and it was found that they have the same origin, and probably a unique provenance. The most considered area of Haltern 70 type, Guadalquivir valley, is not likely to be the origin of CV Haltern 70 amphorae. Moreover, it is quite possible that these amphorae were produced in a region with Nb rich soils. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=184556119
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s00339-025-08313-4
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 11
        StartPage: 1
    Subjects:
      – SubjectFull: X-ray microanalysis
        Type: general
      – SubjectFull: X-ray fluorescence
        Type: general
      – SubjectFull: Principal components analysis
        Type: general
      – SubjectFull: Fluorescence spectroscopy
        Type: general
      – SubjectFull: X-ray diffraction
        Type: general
    Titles:
      – TitleFull: X-ray compositional microanalysis and X-ray diffraction of Haltern 70 amphorae sherds.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Pinheiro, Daniel
      – PersonEntity:
          Name:
            NameFull: Guerra, Mauro
      – PersonEntity:
          Name:
            NameFull: Silva, António J. M.
      – PersonEntity:
          Name:
            NameFull: Stieghorst, Christian
      – PersonEntity:
          Name:
            NameFull: Costa, Benilde F. O.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 04
              Text: Apr2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 09478396
          Numbering:
            – Type: volume
              Value: 131
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: Applied Physics A: Materials Science & Processing
              Type: main
ResultId 1