X-ray compositional microanalysis and X-ray diffraction of Haltern 70 amphorae sherds.
Saved in:
| Title: | X-ray compositional microanalysis and X-ray diffraction of Haltern 70 amphorae sherds. |
|---|---|
| Authors: | Pinheiro, Daniel1 (AUTHOR), Guerra, Mauro1 (AUTHOR), Silva, António J. M.2 (AUTHOR), Stieghorst, Christian3 (AUTHOR), Costa, Benilde F. O.4 (AUTHOR) benilde@uc.pt |
| Source: | Applied Physics A: Materials Science & Processing. Apr2025, Vol. 131 Issue 4, p1-11. 11p. |
| Subjects: | X-ray microanalysis, X-ray fluorescence, Principal components analysis, Fluorescence spectroscopy, X-ray diffraction |
| Abstract: | About 100 sherds from Haltern 70 amphorae recovered from Castro do Vieito (NW Portugal) and from kiln sites located at Guadalquivir valley, Rio Tinto valley, bay of Cadix and Algarve coast, were analyzed by X-ray fluorescence spectroscopy (XRF) and X-ray diffraction (XRD). The study aimed mainly to verify the provenance of Castro do Vieito (CV) Haltern 70 amphorae. Principal components analysis (PCA) and cluster analysis (CA) were performed. A CV sherd with a potter's stamp "LH..." was studied among other CV sherds and it was found that they have the same origin, and probably a unique provenance. The most considered area of Haltern 70 type, Guadalquivir valley, is not likely to be the origin of CV Haltern 70 amphorae. Moreover, it is quite possible that these amphorae were produced in a region with Nb rich soils. [ABSTRACT FROM AUTHOR] |
| Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| FullText | Links: – Type: pdflink Text: Availability: 1 |
|---|---|
| Header | DbId: egs DbLabel: Engineering Source An: 184556119 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: X-ray compositional microanalysis and X-ray diffraction of Haltern 70 amphorae sherds. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Pinheiro%2C+Daniel%22">Pinheiro, Daniel</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Guerra%2C+Mauro%22">Guerra, Mauro</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Silva%2C+António+J%2E+M%2E%22">Silva, António J. M.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Stieghorst%2C+Christian%22">Stieghorst, Christian</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Costa%2C+Benilde+F%2E+O%2E%22">Costa, Benilde F. O.</searchLink><relatesTo>4</relatesTo> (AUTHOR)<i> benilde@uc.pt</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Applied+Physics+A%3A+Materials+Science+%26+Processing%22">Applied Physics A: Materials Science & Processing</searchLink>. Apr2025, Vol. 131 Issue 4, p1-11. 11p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22X-ray+microanalysis%22">X-ray microanalysis</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+fluorescence%22">X-ray fluorescence</searchLink><br /><searchLink fieldCode="DE" term="%22Principal+components+analysis%22">Principal components analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Fluorescence+spectroscopy%22">Fluorescence spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: About 100 sherds from Haltern 70 amphorae recovered from Castro do Vieito (NW Portugal) and from kiln sites located at Guadalquivir valley, Rio Tinto valley, bay of Cadix and Algarve coast, were analyzed by X-ray fluorescence spectroscopy (XRF) and X-ray diffraction (XRD). The study aimed mainly to verify the provenance of Castro do Vieito (CV) Haltern 70 amphorae. Principal components analysis (PCA) and cluster analysis (CA) were performed. A CV sherd with a potter's stamp "LH..." was studied among other CV sherds and it was found that they have the same origin, and probably a unique provenance. The most considered area of Haltern 70 type, Guadalquivir valley, is not likely to be the origin of CV Haltern 70 amphorae. Moreover, it is quite possible that these amphorae were produced in a region with Nb rich soils. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=184556119 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s00339-025-08313-4 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 1 Subjects: – SubjectFull: X-ray microanalysis Type: general – SubjectFull: X-ray fluorescence Type: general – SubjectFull: Principal components analysis Type: general – SubjectFull: Fluorescence spectroscopy Type: general – SubjectFull: X-ray diffraction Type: general Titles: – TitleFull: X-ray compositional microanalysis and X-ray diffraction of Haltern 70 amphorae sherds. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Pinheiro, Daniel – PersonEntity: Name: NameFull: Guerra, Mauro – PersonEntity: Name: NameFull: Silva, António J. M. – PersonEntity: Name: NameFull: Stieghorst, Christian – PersonEntity: Name: NameFull: Costa, Benilde F. O. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 09478396 Numbering: – Type: volume Value: 131 – Type: issue Value: 4 Titles: – TitleFull: Applied Physics A: Materials Science & Processing Type: main |
| ResultId | 1 |