APA (7th ed.) Citation

Chen, Z., Hu, X., Xia, X., Gao, Y., Xu, T., Lo, D., & Yang, X. (2024). Exploiting Library Vulnerability via Migration Based Automating Test Generation. ICSE: International Conference on Software Engineering, 1. https://doi.org/10.1145/3597503.3639583

Chicago Style (17th ed.) Citation

Chen, Zirui, Xing Hu, Xin Xia, Yi Gao, Tongtong Xu, David Lo, and Xiaohu Yang. "Exploiting Library Vulnerability via Migration Based Automating Test Generation." ICSE: International Conference on Software Engineering 2024: 1. https://doi.org/10.1145/3597503.3639583.

MLA (9th ed.) Citation

Chen, Zirui, et al. "Exploiting Library Vulnerability via Migration Based Automating Test Generation." ICSE: International Conference on Software Engineering, 2024, p. 1, https://doi.org/10.1145/3597503.3639583.