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Influence of spacer layer thickness on the current-in-plane magnetoresistance in Co/Cu multilayered films.

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Title: Influence of spacer layer thickness on the current-in-plane magnetoresistance in Co/Cu multilayered films.
Authors: Elsafi, Bassem1 (AUTHOR) bassem.elsafi@yahoo.fr
Source: Applied Physics A: Materials Science & Processing. May2025, Vol. 131 Issue 5, p1-9. 9p.
Subjects: Copper, Interfacial roughness, Electrical resistivity, Electron scattering, Sandwich construction (Materials)
Abstract: This study investigates the magnetoresistance (MR) properties of Co/Cu/Co sandwich structures with a Co layer thickness of 20 Å, focusing on the influence of the Cu layer thickness on MR under varying interface and surface qualities. Theoretical modeling, based on the semiclassical Boltzmann approach, predicts that the MR ratio is significantly influenced by Cu layer thickness due to spin-dependent scattering of conduction electrons at the Co/Cu interfaces. Numerical results indicate that MR increases with Cu layer thickness ranging from 5 Å to 60 Å, reaching an optimal point, after which it declines, provided the interface roughness is zero. High-quality, smooth interfaces and surfaces are found to enhance MR ratios by reducing spin-independent scattering and reinforcing the spin-dependent MR effect. The excellent overall agreement between theoretical and experimental findings underscores the crucial role of Cu layer thickness and interface and surface quality in enhancing MR in Co/Cu multilayers. These results have practical implications for potential applications in data storage and sensor technologies, where optimizing MR properties is essential. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Influence of spacer layer thickness on the current-in-plane magnetoresistance in Co/Cu multilayered films.
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  Data: <searchLink fieldCode="AR" term="%22Elsafi%2C+Bassem%22">Elsafi, Bassem</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> bassem.elsafi@yahoo.fr</i>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+A%3A+Materials+Science+%26+Processing%22">Applied Physics A: Materials Science & Processing</searchLink>. May2025, Vol. 131 Issue 5, p1-9. 9p.
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  Data: <searchLink fieldCode="DE" term="%22Copper%22">Copper</searchLink><br /><searchLink fieldCode="DE" term="%22Interfacial+roughness%22">Interfacial roughness</searchLink><br /><searchLink fieldCode="DE" term="%22Electrical+resistivity%22">Electrical resistivity</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+scattering%22">Electron scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Sandwich+construction+%28Materials%29%22">Sandwich construction (Materials)</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: This study investigates the magnetoresistance (MR) properties of Co/Cu/Co sandwich structures with a Co layer thickness of 20 Å, focusing on the influence of the Cu layer thickness on MR under varying interface and surface qualities. Theoretical modeling, based on the semiclassical Boltzmann approach, predicts that the MR ratio is significantly influenced by Cu layer thickness due to spin-dependent scattering of conduction electrons at the Co/Cu interfaces. Numerical results indicate that MR increases with Cu layer thickness ranging from 5 Å to 60 Å, reaching an optimal point, after which it declines, provided the interface roughness is zero. High-quality, smooth interfaces and surfaces are found to enhance MR ratios by reducing spin-independent scattering and reinforcing the spin-dependent MR effect. The excellent overall agreement between theoretical and experimental findings underscores the crucial role of Cu layer thickness and interface and surface quality in enhancing MR in Co/Cu multilayers. These results have practical implications for potential applications in data storage and sensor technologies, where optimizing MR properties is essential. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s00339-025-08515-w
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      – Code: eng
        Text: English
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      – SubjectFull: Copper
        Type: general
      – SubjectFull: Interfacial roughness
        Type: general
      – SubjectFull: Electrical resistivity
        Type: general
      – SubjectFull: Electron scattering
        Type: general
      – SubjectFull: Sandwich construction (Materials)
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      – TitleFull: Influence of spacer layer thickness on the current-in-plane magnetoresistance in Co/Cu multilayered films.
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              Text: May2025
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