Yoo, S., Hong, E., Choi, Y., & Lee, H. (2025). Internal Stress of Titanium-Based Nitride with Penetration Depth and Surface Roughness by sin 2 ψ Method Using HR-XRD. Nanomaterials (2079-4991), 15(11), 813. https://doi.org/10.3390/nano15110813
Chicago Style (17th ed.) CitationYoo, Sungju, Eunpyo Hong, Youngkue Choi, and Heesoo Lee. "Internal Stress of Titanium-Based Nitride with Penetration Depth and Surface Roughness by Sin 2 ψ Method Using HR-XRD." Nanomaterials (2079-4991) 15, no. 11 (2025): 813. https://doi.org/10.3390/nano15110813.
MLA (9th ed.) CitationYoo, Sungju, et al. "Internal Stress of Titanium-Based Nitride with Penetration Depth and Surface Roughness by Sin 2 ψ Method Using HR-XRD." Nanomaterials (2079-4991), vol. 15, no. 11, 2025, p. 813, https://doi.org/10.3390/nano15110813.