View in EDS HTML Full Text PDF Full Text

Characterization of CuO‐Doped SnO2 Thin Films Prepared by Sol–Gel and Dip‐Coating: A Multi‐Analytical Approach.

Saved in:
Bibliographic Details
Title: Characterization of CuO‐Doped SnO2 Thin Films Prepared by Sol–Gel and Dip‐Coating: A Multi‐Analytical Approach.
Authors: Poiasina, M. P.1 (AUTHOR), Bianchetti, M. F.1 (AUTHOR), Bojorge, C. D.1 (AUTHOR), Gard, F. S.2 (AUTHOR) fsgard01@gmail.com
Source: Surface & Interface Analysis: SIA. Aug2025, Vol. 57 Issue 8, p600-618. 19p.
Subjects: Electron backscattering, Photoelectron spectroscopy, Thin films, X-ray diffraction, Copper films
Abstract: In the current work, we comprehensively studied focus‐doped (5%) SnO2 thin films, using scanning electron microscopy (SEM), X‐ray diffraction (XRD), and X‐ray photoemission spectroscopy (XPS). The films were synthesized via a sol–gel process followed by a dip‐coating deposition technique to form three‐layered structures. To understand the impact of annealing on the properties of the films, we analyzed samples both without annealing and with annealing at 400°C. Electron backscattering (BS) images revealed distinct differences in surface structures between annealed and non‐annealed films. The annealed films exhibited a more uniform and smooth surface with fewer defects, while the non‐annealed films showed a network of cracks and delaminations. XRD analysis of the annealed films indicated the formation of SnO2 nanoparticles with an average size of 9 ± 1 nm, verifying the crystallinity and nanometric size of the material with heat treatment. XPS depth profiling demonstrated the presence of a metallic tin (Sn0) layer at the interface of the films. The surface tin film was in mixed oxidation states, involving both Sn4+ and Sn2+. Additionally, the copper within the films was found to exist as Cu2+ and Cu+. [ABSTRACT FROM AUTHOR]
Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: egs
DbLabel: Engineering Source
An: 186371108
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Characterization of CuO‐Doped SnO<subscript>2</subscript> Thin Films Prepared by Sol–Gel and Dip‐Coating: A Multi‐Analytical Approach.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Poiasina%2C+M%2E P%2E%22">Poiasina, M. P.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Bianchetti%2C+M%2E F%2E%22">Bianchetti, M. F.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Bojorge%2C+C%2E D%2E%22">Bojorge, C. D.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Gard%2C+F%2E S%2E%22">Gard, F. S.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> fsgard01@gmail.com</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Surface+%26+Interface+Analysis%3A+SIA%22">Surface & Interface Analysis: SIA</searchLink>. Aug2025, Vol. 57 Issue 8, p600-618. 19p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Electron+backscattering%22">Electron backscattering</searchLink><br /><searchLink fieldCode="DE" term="%22Photoelectron+spectroscopy%22">Photoelectron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Copper+films%22">Copper films</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: In the current work, we comprehensively studied focus‐doped (5%) SnO2 thin films, using scanning electron microscopy (SEM), X‐ray diffraction (XRD), and X‐ray photoemission spectroscopy (XPS). The films were synthesized via a sol–gel process followed by a dip‐coating deposition technique to form three‐layered structures. To understand the impact of annealing on the properties of the films, we analyzed samples both without annealing and with annealing at 400°C. Electron backscattering (BS) images revealed distinct differences in surface structures between annealed and non‐annealed films. The annealed films exhibited a more uniform and smooth surface with fewer defects, while the non‐annealed films showed a network of cracks and delaminations. XRD analysis of the annealed films indicated the formation of SnO2 nanoparticles with an average size of 9 ± 1 nm, verifying the crystallinity and nanometric size of the material with heat treatment. XPS depth profiling demonstrated the presence of a metallic tin (Sn0) layer at the interface of the films. The surface tin film was in mixed oxidation states, involving both Sn4+ and Sn2+. Additionally, the copper within the films was found to exist as Cu2+ and Cu+. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=186371108
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1002/sia.7418
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 19
        StartPage: 600
    Subjects:
      – SubjectFull: Electron backscattering
        Type: general
      – SubjectFull: Photoelectron spectroscopy
        Type: general
      – SubjectFull: Thin films
        Type: general
      – SubjectFull: X-ray diffraction
        Type: general
      – SubjectFull: Copper films
        Type: general
    Titles:
      – TitleFull: Characterization of CuO‐Doped SnO2 Thin Films Prepared by Sol–Gel and Dip‐Coating: A Multi‐Analytical Approach.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Poiasina, M. P.
      – PersonEntity:
          Name:
            NameFull: Bianchetti, M. F.
      – PersonEntity:
          Name:
            NameFull: Bojorge, C. D.
      – PersonEntity:
          Name:
            NameFull: Gard, F. S.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 08
              Text: Aug2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 01422421
          Numbering:
            – Type: volume
              Value: 57
            – Type: issue
              Value: 8
          Titles:
            – TitleFull: Surface & Interface Analysis: SIA
              Type: main
ResultId 1