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Determining errors in force measurements for colloids close to contact.

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Title: Determining errors in force measurements for colloids close to contact.
Authors: Yücel, Harun1 (AUTHOR) harunyucel@bayburt.edu.tr
Source: Applied Physics A: Materials Science & Processing. Jul2025, Vol. 131 Issue 7, p1-9. 9p.
Subjects: Diffraction patterns, Video microscopy, Digital video, Measurement errors, Optical diffraction
Abstract: Due to diffraction patterns in light microscopy, the overlapping of colloid images introduces minor errors in determining particle positions, which affecting the accuracy of observing interactions between colloids near contact. This study quantitatively investigates the errors arising from the overlapping effect in force measurements between two closely positioned colloids using digital video microscopy (DVM). For this aim, computer simulations were conducted to obtain the positions of two optically trapped colloids interacting based on a force model and particle images were generated as a time series using experimental particle intensity profiles for two different particle sizes. These generated images were analyzed using tracking algorithms from the literature and the interaction forces were extracted and compared with theoretical force values. The results demonstrated that diffraction patterns significantly influence the accuracy of particle position detection and interaction force calculations. Large diffraction patterns and intensity fluctuations in an image introduce significant errors. However, these errors can become significantly smaller in the presence of large forces and may therefore be considered negligible. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Determining errors in force measurements for colloids close to contact.
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  Data: <searchLink fieldCode="AR" term="%22Yücel%2C+Harun%22">Yücel, Harun</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> harunyucel@bayburt.edu.tr</i>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+A%3A+Materials+Science+%26+Processing%22">Applied Physics A: Materials Science & Processing</searchLink>. Jul2025, Vol. 131 Issue 7, p1-9. 9p.
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  Data: <searchLink fieldCode="DE" term="%22Diffraction+patterns%22">Diffraction patterns</searchLink><br /><searchLink fieldCode="DE" term="%22Video+microscopy%22">Video microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+video%22">Digital video</searchLink><br /><searchLink fieldCode="DE" term="%22Measurement+errors%22">Measurement errors</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+diffraction%22">Optical diffraction</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Due to diffraction patterns in light microscopy, the overlapping of colloid images introduces minor errors in determining particle positions, which affecting the accuracy of observing interactions between colloids near contact. This study quantitatively investigates the errors arising from the overlapping effect in force measurements between two closely positioned colloids using digital video microscopy (DVM). For this aim, computer simulations were conducted to obtain the positions of two optically trapped colloids interacting based on a force model and particle images were generated as a time series using experimental particle intensity profiles for two different particle sizes. These generated images were analyzed using tracking algorithms from the literature and the interaction forces were extracted and compared with theoretical force values. The results demonstrated that diffraction patterns significantly influence the accuracy of particle position detection and interaction force calculations. Large diffraction patterns and intensity fluctuations in an image introduce significant errors. However, these errors can become significantly smaller in the presence of large forces and may therefore be considered negligible. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s00339-025-08668-8
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        Text: English
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      – SubjectFull: Video microscopy
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      – SubjectFull: Digital video
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      – TitleFull: Determining errors in force measurements for colloids close to contact.
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              Text: Jul2025
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