Spectral line identification for highly charged heavy ions in soft X-ray and EUV regions based on Z-dependence measurements.
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| Title: | Spectral line identification for highly charged heavy ions in soft X-ray and EUV regions based on Z-dependence measurements. |
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| Authors: | Suzuki, Chihiro1,2 (AUTHOR) csuzuki@nifs.ac.jp, Koike, Fumihiro3 (AUTHOR), Tamura, Naoki4 (AUTHOR), Oishi, Tetsutarou5 (AUTHOR), Nakamura, Nobuyuki6 (AUTHOR), Murakami, Izumi1,2 (AUTHOR) |
| Source: | European Physical Journal D (EPJ D). Jun2025, Vol. 79 Issue 6, p1-10. 10p. |
| Subjects: | Heavy ions, Soft X rays, Grazing incidence, Electron configuration, High temperature plasmas, Ultraviolet spectra, Spectral lines |
| Abstract: | This study focuses on new identifications of discrete spectral lines of heavy ions with one or two outermost 4s/4p subshell electrons in soft X-ray and extreme ultraviolet regions. The study is basically based on the spectroscopic data systematically taken in the last decades in high-temperature plasmas produced in the Large Helical Device using multiple grazing incidence spectrometers. In addition, we have newly taken spectroscopic data using the Tokyo electron beam ion trap (EBIT) for some of the missing elements in the past EBIT experiments. Consequently, we could identify a number of discrete lines experimentally for the first time in this study based on the detailed atomic number (Z)-dependences of the wavelengths of major resonance lines. Some transitions of Ga- and Ge-like ions show irregular Z-dependences in which the transition wavelength suddenly shifts to another curve at around a specific Z due to the effect of strong configuration interaction. [ABSTRACT FROM AUTHOR] |
| Copyright of European Physical Journal D (EPJ D) is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 186988278 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Spectral line identification for highly charged heavy ions in soft X-ray and EUV regions based on Z-dependence measurements. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Suzuki%2C+Chihiro%22">Suzuki, Chihiro</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> csuzuki@nifs.ac.jp</i><br /><searchLink fieldCode="AR" term="%22Koike%2C+Fumihiro%22">Koike, Fumihiro</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tamura%2C+Naoki%22">Tamura, Naoki</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Oishi%2C+Tetsutarou%22">Oishi, Tetsutarou</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nakamura%2C+Nobuyuki%22">Nakamura, Nobuyuki</searchLink><relatesTo>6</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Murakami%2C+Izumi%22">Murakami, Izumi</searchLink><relatesTo>1,2</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22European+Physical+Journal+D+%28EPJ+D%29%22">European Physical Journal D (EPJ D)</searchLink>. Jun2025, Vol. 79 Issue 6, p1-10. 10p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Heavy+ions%22">Heavy ions</searchLink><br /><searchLink fieldCode="DE" term="%22Soft+X+rays%22">Soft X rays</searchLink><br /><searchLink fieldCode="DE" term="%22Grazing+incidence%22">Grazing incidence</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+configuration%22">Electron configuration</searchLink><br /><searchLink fieldCode="DE" term="%22High+temperature+plasmas%22">High temperature plasmas</searchLink><br /><searchLink fieldCode="DE" term="%22Ultraviolet+spectra%22">Ultraviolet spectra</searchLink><br /><searchLink fieldCode="DE" term="%22Spectral+lines%22">Spectral lines</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: This study focuses on new identifications of discrete spectral lines of heavy ions with one or two outermost 4s/4p subshell electrons in soft X-ray and extreme ultraviolet regions. The study is basically based on the spectroscopic data systematically taken in the last decades in high-temperature plasmas produced in the Large Helical Device using multiple grazing incidence spectrometers. In addition, we have newly taken spectroscopic data using the Tokyo electron beam ion trap (EBIT) for some of the missing elements in the past EBIT experiments. Consequently, we could identify a number of discrete lines experimentally for the first time in this study based on the detailed atomic number (Z)-dependences of the wavelengths of major resonance lines. Some transitions of Ga- and Ge-like ions show irregular Z-dependences in which the transition wavelength suddenly shifts to another curve at around a specific Z due to the effect of strong configuration interaction. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of European Physical Journal D (EPJ D) is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=186988278 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1140/epjd/s10053-025-01026-6 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 1 Subjects: – SubjectFull: Heavy ions Type: general – SubjectFull: Soft X rays Type: general – SubjectFull: Grazing incidence Type: general – SubjectFull: Electron configuration Type: general – SubjectFull: High temperature plasmas Type: general – SubjectFull: Ultraviolet spectra Type: general – SubjectFull: Spectral lines Type: general Titles: – TitleFull: Spectral line identification for highly charged heavy ions in soft X-ray and EUV regions based on Z-dependence measurements. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Suzuki, Chihiro – PersonEntity: Name: NameFull: Koike, Fumihiro – PersonEntity: Name: NameFull: Tamura, Naoki – PersonEntity: Name: NameFull: Oishi, Tetsutarou – PersonEntity: Name: NameFull: Nakamura, Nobuyuki – PersonEntity: Name: NameFull: Murakami, Izumi IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 14346060 Numbering: – Type: volume Value: 79 – Type: issue Value: 6 Titles: – TitleFull: European Physical Journal D (EPJ D) Type: main |
| ResultId | 1 |
