Shi, D., Hu, X., Li, Y., Jiang, N., & Ye, H. (2025). Measurement of surface rectangular defect depth based on laser-excited transmitted surface waves. Nondestructive Testing & Evaluation, 40(9), 4114. https://doi.org/10.1080/10589759.2024.2417259
Chicago Style (17th ed.) CitationShi, Dinghui, Xiaoping Hu, Ying Li, Nanchao Jiang, and Hongxian Ye. "Measurement of Surface Rectangular Defect Depth Based on Laser-excited Transmitted Surface Waves." Nondestructive Testing & Evaluation 40, no. 9 (2025): 4114. https://doi.org/10.1080/10589759.2024.2417259.
MLA (9th ed.) CitationShi, Dinghui, et al. "Measurement of Surface Rectangular Defect Depth Based on Laser-excited Transmitted Surface Waves." Nondestructive Testing & Evaluation, vol. 40, no. 9, 2025, p. 4114, https://doi.org/10.1080/10589759.2024.2417259.