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Measurements of source emittance and beam coherence properties of the upgraded Advanced Photon Source.

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Title: Measurements of source emittance and beam coherence properties of the upgraded Advanced Photon Source.
Authors: Shi, Xianbo1 (AUTHOR) xshi@anl.gov, Lin, Yu-Chung1 (AUTHOR), Zhao, Jiyong1 (AUTHOR), Toellner, Thomas1 (AUTHOR), Hu, Michael Y.1 (AUTHOR), Seifert, Soenke1 (AUTHOR), Lee, Byeongdu1 (AUTHOR), Grizolli, Walan2 (AUTHOR), Wojcik, Michael J.1 (AUTHOR), Rebuffi, Luca1 (AUTHOR), Assoufid, Lahsen1 (AUTHOR), Sajaev, Vadim1 (AUTHOR)
Source: Journal of Synchrotron Radiation. Sep2025, Vol. 32 Issue 5, p1152-1161. 10p.
Subjects: Coherence (Physics), Electron beams, Synchrotron radiation sources, Beam dynamics, Interferometry, X-ray optics, Synchrotrons, Optical aberrations
Abstract: The Advanced Photon Source (APS) has been upgraded with a multi‐bend achromat lattice, achieving significantly reduced electron beam emittance and enhanced X‐ray coherence. Precise characterization of these properties is essential for optimizing beamline performance and enabling new experiments that take full advantage of the upgraded source. We report on measurements of source size and transverse coherence properties using grating interferometry at two beamlines: the APS 3‐ID‐B undulator beamline and the 1‐BM‐B bending magnet beamline. The results confirm the world‐record horizontal emittance of the upgraded APS below 30 pm rad and validate the theoretical design parameters. We further investigate the impact of optical aberrations and mechanical vibrations at the 12‐ID‐C beamline on coherence preservation. These measurements establish a benchmark for future beamline enhancements and demonstrate the effectiveness of grating interferometry for high‐precision beam characterization. Our findings provide critical insights into synchrotron beam dynamics, coherence degradation mechanisms, and strategies for optimizing beamline X‐ray optics at next‐generation light sources. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Label: Title
  Group: Ti
  Data: Measurements of source emittance and beam coherence properties of the upgraded Advanced Photon Source.
– Name: Author
  Label: Authors
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  Data: <searchLink fieldCode="AR" term="%22Shi%2C+Xianbo%22">Shi, Xianbo</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> xshi@anl.gov</i><br /><searchLink fieldCode="AR" term="%22Lin%2C+Yu-Chung%22">Lin, Yu-Chung</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhao%2C+Jiyong%22">Zhao, Jiyong</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Toellner%2C+Thomas%22">Toellner, Thomas</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Hu%2C+Michael+Y%2E%22">Hu, Michael Y.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Seifert%2C+Soenke%22">Seifert, Soenke</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lee%2C+Byeongdu%22">Lee, Byeongdu</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Grizolli%2C+Walan%22">Grizolli, Walan</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wojcik%2C+Michael+J%2E%22">Wojcik, Michael J.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Rebuffi%2C+Luca%22">Rebuffi, Luca</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Assoufid%2C+Lahsen%22">Assoufid, Lahsen</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sajaev%2C+Vadim%22">Sajaev, Vadim</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. Sep2025, Vol. 32 Issue 5, p1152-1161. 10p.
– Name: Subject
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  Data: <searchLink fieldCode="DE" term="%22Coherence+%28Physics%29%22">Coherence (Physics)</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+beams%22">Electron beams</searchLink><br /><searchLink fieldCode="DE" term="%22Synchrotron+radiation+sources%22">Synchrotron radiation sources</searchLink><br /><searchLink fieldCode="DE" term="%22Beam+dynamics%22">Beam dynamics</searchLink><br /><searchLink fieldCode="DE" term="%22Interferometry%22">Interferometry</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+optics%22">X-ray optics</searchLink><br /><searchLink fieldCode="DE" term="%22Synchrotrons%22">Synchrotrons</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+aberrations%22">Optical aberrations</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The Advanced Photon Source (APS) has been upgraded with a multi‐bend achromat lattice, achieving significantly reduced electron beam emittance and enhanced X‐ray coherence. Precise characterization of these properties is essential for optimizing beamline performance and enabling new experiments that take full advantage of the upgraded source. We report on measurements of source size and transverse coherence properties using grating interferometry at two beamlines: the APS 3‐ID‐B undulator beamline and the 1‐BM‐B bending magnet beamline. The results confirm the world‐record horizontal emittance of the upgraded APS below 30 pm rad and validate the theoretical design parameters. We further investigate the impact of optical aberrations and mechanical vibrations at the 12‐ID‐C beamline on coherence preservation. These measurements establish a benchmark for future beamline enhancements and demonstrate the effectiveness of grating interferometry for high‐precision beam characterization. Our findings provide critical insights into synchrotron beam dynamics, coherence degradation mechanisms, and strategies for optimizing beamline X‐ray optics at next‐generation light sources. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=187818828
RecordInfo BibRecord:
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        Value: 10.1107/S160057752500579X
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 10
        StartPage: 1152
    Subjects:
      – SubjectFull: Coherence (Physics)
        Type: general
      – SubjectFull: Electron beams
        Type: general
      – SubjectFull: Synchrotron radiation sources
        Type: general
      – SubjectFull: Beam dynamics
        Type: general
      – SubjectFull: Interferometry
        Type: general
      – SubjectFull: X-ray optics
        Type: general
      – SubjectFull: Synchrotrons
        Type: general
      – SubjectFull: Optical aberrations
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      – TitleFull: Measurements of source emittance and beam coherence properties of the upgraded Advanced Photon Source.
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            – D: 01
              M: 09
              Text: Sep2025
              Type: published
              Y: 2025
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