APA (7th ed.) Citation

Nabipour, S., & Javidan, J. (2025). Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories Through Optimal Design of BCH Codes. Journal of Circuits, Systems & Computers, 34(17), 1. https://doi.org/10.1142/S0218126624502256

Chicago Style (17th ed.) Citation

Nabipour, Saeideh, and Javad Javidan. "Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories Through Optimal Design of BCH Codes." Journal of Circuits, Systems & Computers 34, no. 17 (2025): 1. https://doi.org/10.1142/S0218126624502256.

MLA (9th ed.) Citation

Nabipour, Saeideh, and Javad Javidan. "Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories Through Optimal Design of BCH Codes." Journal of Circuits, Systems & Computers, vol. 34, no. 17, 2025, p. 1, https://doi.org/10.1142/S0218126624502256.