APA (7th ed.) Citation

Modregger, P., Wittwer, F., Khaliq, A., Pyrlik, N., Ball, J. A. D., Garrevoet, J., . . . Stuckelberger, M. (2025). Ultimate sensitivity in X‐ray diffraction: Angular moments versus shot noise. Journal of Applied Crystallography, 58(5), 1653. https://doi.org/10.1107/S1600576725006715

Chicago Style (17th ed.) Citation

Modregger, Peter, Felix Wittwer, Ahmar Khaliq, Niklas Pyrlik, James A. D. Ball, Jan Garrevoet, Gerald Falkenberg, Alexander Liehr, and Michael Stuckelberger. "Ultimate Sensitivity in X‐ray Diffraction: Angular Moments Versus Shot Noise." Journal of Applied Crystallography 58, no. 5 (2025): 1653. https://doi.org/10.1107/S1600576725006715.

MLA (9th ed.) Citation

Modregger, Peter, et al. "Ultimate Sensitivity in X‐ray Diffraction: Angular Moments Versus Shot Noise." Journal of Applied Crystallography, vol. 58, no. 5, 2025, p. 1653, https://doi.org/10.1107/S1600576725006715.