Thallium-activated cesium hexafluorosilicate (Cs2SiF6:Tl+) micro-crystalline compound prepared by a facile solvothermal method and its luminescence properties.
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| Title: | Thallium-activated cesium hexafluorosilicate (Cs2SiF6:Tl+) micro-crystalline compound prepared by a facile solvothermal method and its luminescence properties. |
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| Authors: | Daniel, D. Joseph1 (AUTHOR), Devakumar, Balaji2 (AUTHOR), Kim, H.J.1 (AUTHOR) hongjoo@knu.ac.kr |
| Source: | Ceramics International. Jan2026, Vol. 52 Issue 1, p242-251. 10p. |
| Subjects: | Thallium, Photoluminescence, Thermal stability, Solution (Chemistry), X-ray diffraction, Inorganic compounds, Luminescence measurement, Optical devices |
| Abstract: | A heavily thallium-activated cesium hexafluorosilicate compound (Cs 2 SiF 6) was synthesised using a facile solvothermal method. Powder X-ray diffraction pattern analysis confirmed the single-phase of the synthesised compound, which is consistent with standard reference data. Further structural refinement was performed through the Rietveld method using FullProf software and indicating that Cs 2 SiF 6 crystalizes in a cubic crystal system with the space group F m 3 ‾ m. The calculated unit cell parameters are a = 8.91832 Å, α = β = γ = 90°, V = 709.332 Å3. The FE-SEM images reveal that the synthesised compound is well-crystallized, exhibiting a uniform hexagonal morphology with particle sizes ranging from 10 to 50 μm. The elemental distribution and stoichiometry of the synthesised compound were verified through EDS spectral analysis. The XPS analysis verified the presence of thallium in the +1 oxidation state (Tl+), confirming the successful substitution of Cs + ions within the Cs 2 SiF 6 lattice. Thermal behaviour was examined using TGA/DSC, which demonstrated that the material remains stable up to 675 °C. The Tl + activated Cs 2 SiF 6 samples are capable of producing strong emission at 306 nm under X-ray excitation. Photoluminescence measurements at room temperature revealed a maximum emission peak at 312 nm upon excitation with 206 nm radiation. The TL glow curve analysis shows the presence of a trap center at 369 K, and its kinetic parameters were estimated. The luminescence behaviour of thallium-activated cesium hexafluorosilicate has been examined for the first time, and the preliminary findings suggest that the material holds promise for future optical applications. [ABSTRACT FROM AUTHOR] |
| Copyright of Ceramics International is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Items | – Name: Title Label: Title Group: Ti Data: Thallium-activated cesium hexafluorosilicate (Cs2SiF6:Tl+) micro-crystalline compound prepared by a facile solvothermal method and its luminescence properties. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Daniel%2C+D%2E+Joseph%22">Daniel, D. Joseph</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Devakumar%2C+Balaji%22">Devakumar, Balaji</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kim%2C+H%2EJ%2E%22">Kim, H.J.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> hongjoo@knu.ac.kr</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Ceramics+International%22">Ceramics International</searchLink>. Jan2026, Vol. 52 Issue 1, p242-251. 10p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Thallium%22">Thallium</searchLink><br /><searchLink fieldCode="DE" term="%22Photoluminescence%22">Photoluminescence</searchLink><br /><searchLink fieldCode="DE" term="%22Thermal+stability%22">Thermal stability</searchLink><br /><searchLink fieldCode="DE" term="%22Solution+%28Chemistry%29%22">Solution (Chemistry)</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Inorganic+compounds%22">Inorganic compounds</searchLink><br /><searchLink fieldCode="DE" term="%22Luminescence+measurement%22">Luminescence measurement</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+devices%22">Optical devices</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: A heavily thallium-activated cesium hexafluorosilicate compound (Cs 2 SiF 6) was synthesised using a facile solvothermal method. Powder X-ray diffraction pattern analysis confirmed the single-phase of the synthesised compound, which is consistent with standard reference data. Further structural refinement was performed through the Rietveld method using FullProf software and indicating that Cs 2 SiF 6 crystalizes in a cubic crystal system with the space group F m 3 ‾ m. The calculated unit cell parameters are a = 8.91832 Å, α = β = γ = 90°, V = 709.332 Å3. The FE-SEM images reveal that the synthesised compound is well-crystallized, exhibiting a uniform hexagonal morphology with particle sizes ranging from 10 to 50 μm. The elemental distribution and stoichiometry of the synthesised compound were verified through EDS spectral analysis. The XPS analysis verified the presence of thallium in the +1 oxidation state (Tl+), confirming the successful substitution of Cs + ions within the Cs 2 SiF 6 lattice. Thermal behaviour was examined using TGA/DSC, which demonstrated that the material remains stable up to 675 °C. The Tl + activated Cs 2 SiF 6 samples are capable of producing strong emission at 306 nm under X-ray excitation. Photoluminescence measurements at room temperature revealed a maximum emission peak at 312 nm upon excitation with 206 nm radiation. The TL glow curve analysis shows the presence of a trap center at 369 K, and its kinetic parameters were estimated. The luminescence behaviour of thallium-activated cesium hexafluorosilicate has been examined for the first time, and the preliminary findings suggest that the material holds promise for future optical applications. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Ceramics International is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.ceramint.2025.11.313 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 242 Subjects: – SubjectFull: Thallium Type: general – SubjectFull: Photoluminescence Type: general – SubjectFull: Thermal stability Type: general – SubjectFull: Solution (Chemistry) Type: general – SubjectFull: X-ray diffraction Type: general – SubjectFull: Inorganic compounds Type: general – SubjectFull: Luminescence measurement Type: general – SubjectFull: Optical devices Type: general Titles: – TitleFull: Thallium-activated cesium hexafluorosilicate (Cs2SiF6:Tl+) micro-crystalline compound prepared by a facile solvothermal method and its luminescence properties. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Daniel, D. Joseph – PersonEntity: Name: NameFull: Devakumar, Balaji – PersonEntity: Name: NameFull: Kim, H.J. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 02728842 Numbering: – Type: volume Value: 52 – Type: issue Value: 1 Titles: – TitleFull: Ceramics International Type: main |
| ResultId | 1 |
