Advanced Testing of Next-Generation DRFM Jammers.

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Bibliographic Details
Title: Advanced Testing of Next-Generation DRFM Jammers.
Authors: Mikhailov, Yassen1
Source: Microwave Journal. Dec2025, Vol. 68 Issue 12, p48-56. 5p.
Subjects: Spectrum analyzers, Spectrum analysis instruments, Electronic industries, Frequency-domain analysis, Engineering inspection, Radio interference
Abstract: The article evaluates digital radio frequency memory (DRFM) system testers from Rohde & Schwarz including the KM700 pulse analysis software and FSWX spectrum and signal analyzer.
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 190286357
AccessLevel: 6
PubType: Periodical
PubTypeId: serialPeriodical
PreciseRelevancyScore: 0
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  Data: Advanced Testing of Next-Generation DRFM Jammers.
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  Data: <searchLink fieldCode="JN" term="%22Microwave+Journal%22">Microwave Journal</searchLink>. Dec2025, Vol. 68 Issue 12, p48-56. 5p.
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  Data: <searchLink fieldCode="DE" term="%22Spectrum+analyzers%22">Spectrum analyzers</searchLink><br /><searchLink fieldCode="DE" term="%22Spectrum+analysis+instruments%22">Spectrum analysis instruments</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+industries%22">Electronic industries</searchLink><br /><searchLink fieldCode="DE" term="%22Frequency-domain+analysis%22">Frequency-domain analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Engineering+inspection%22">Engineering inspection</searchLink><br /><searchLink fieldCode="DE" term="%22Radio+interference%22">Radio interference</searchLink>
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  Label: Abstract
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  Data: The article evaluates digital radio frequency memory (DRFM) system testers from Rohde & Schwarz including the KM700 pulse analysis software and FSWX spectrum and signal analyzer.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=190286357
RecordInfo BibRecord:
  BibEntity:
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 48
    Subjects:
      – SubjectFull: Spectrum analyzers
        Type: general
      – SubjectFull: Spectrum analysis instruments
        Type: general
      – SubjectFull: Electronic industries
        Type: general
      – SubjectFull: Frequency-domain analysis
        Type: general
      – SubjectFull: Engineering inspection
        Type: general
      – SubjectFull: Radio interference
        Type: general
    Titles:
      – TitleFull: Advanced Testing of Next-Generation DRFM Jammers.
        Type: main
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          Name:
            NameFull: Mikhailov, Yassen
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          Dates:
            – D: 01
              M: 12
              Text: Dec2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 01926225
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              Value: 68
            – Type: issue
              Value: 12
          Titles:
            – TitleFull: Microwave Journal
              Type: main
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