Advanced Testing of Next-Generation DRFM Jammers.
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| Title: | Advanced Testing of Next-Generation DRFM Jammers. |
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| Authors: | Mikhailov, Yassen1 |
| Source: | Microwave Journal. Dec2025, Vol. 68 Issue 12, p48-56. 5p. |
| Subjects: | Spectrum analyzers, Spectrum analysis instruments, Electronic industries, Frequency-domain analysis, Engineering inspection, Radio interference |
| Abstract: | The article evaluates digital radio frequency memory (DRFM) system testers from Rohde & Schwarz including the KM700 pulse analysis software and FSWX spectrum and signal analyzer. |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Advanced Testing of Next-Generation DRFM Jammers. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Mikhailov%2C+Yassen%22">Mikhailov, Yassen</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Microwave+Journal%22">Microwave Journal</searchLink>. Dec2025, Vol. 68 Issue 12, p48-56. 5p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Spectrum+analyzers%22">Spectrum analyzers</searchLink><br /><searchLink fieldCode="DE" term="%22Spectrum+analysis+instruments%22">Spectrum analysis instruments</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+industries%22">Electronic industries</searchLink><br /><searchLink fieldCode="DE" term="%22Frequency-domain+analysis%22">Frequency-domain analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Engineering+inspection%22">Engineering inspection</searchLink><br /><searchLink fieldCode="DE" term="%22Radio+interference%22">Radio interference</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The article evaluates digital radio frequency memory (DRFM) system testers from Rohde & Schwarz including the KM700 pulse analysis software and FSWX spectrum and signal analyzer. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=190286357 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 48 Subjects: – SubjectFull: Spectrum analyzers Type: general – SubjectFull: Spectrum analysis instruments Type: general – SubjectFull: Electronic industries Type: general – SubjectFull: Frequency-domain analysis Type: general – SubjectFull: Engineering inspection Type: general – SubjectFull: Radio interference Type: general Titles: – TitleFull: Advanced Testing of Next-Generation DRFM Jammers. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Mikhailov, Yassen IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 12 Text: Dec2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 01926225 Numbering: – Type: volume Value: 68 – Type: issue Value: 12 Titles: – TitleFull: Microwave Journal Type: main |
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