X-ray Diagnostics of Multilayer Ti/Ni Mirrors with Different Configurations of Si Buffer Layer Using X-ray Reflectometry and X-ray Standing Wave Methods.
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| Title: | X-ray Diagnostics of Multilayer Ti/Ni Mirrors with Different Configurations of Si Buffer Layer Using X-ray Reflectometry and X-ray Standing Wave Methods. |
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| Authors: | Seregin, A. Yu.1 (AUTHOR), Volkovsky, Yu. A.1 (AUTHOR) irlandez08@yandex.ru, Prosekov, P. A.1 (AUTHOR), Kardeev, Y. D.1 (AUTHOR), Polkovnikov, V. N.2 (AUTHOR), Smertin, R. M.2 (AUTHOR), Pisarevsky, Yu. V.1 (AUTHOR), Blagov, A. E.1 (AUTHOR) |
| Source: | Crystallography Reports. Dec2025, Vol. 70 Issue 6, p872-877. 6p. |
| Subjects: | X-ray reflectometry, Optical mirrors, Reflectometry, X-ray detection, Optical multilayers, Buffer layers |
| Abstract: | The results of studying the multilayer mirrors (periodic Ti/Ni structures with different configurations of Si buffer layer), which are promising in developing mirror optics for synchrotron radiation, are presented. Samples with period structures Ti/Ni, Ti/Si/Ni, Ti/Ni/Si, and Ti/Si/Ni/Si were investigated by X-ray reflectometry and X-ray standing wave (XSW) methods. It is found that the Ti/Ni system is characterized by the largest thicknesses of transition layers at the Ti/Ni interfaces. Addition of Si interlayers between Ti and Ni layers leads to a decrease in the transition layer thicknesses, while addition of Si only within a period or only between periods leads to asymmetry of electron density profiles and elemental distribution profiles over the structure depth. It is shown that the structure with a Si buffer layer both between layers within a period and between the periods themselves (Ti/Si/Ni/Si) is an optimal mirror configuration in terms of reflectometry intensity. [ABSTRACT FROM AUTHOR] |
| Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 190467606 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: X-ray Diagnostics of Multilayer Ti/Ni Mirrors with Different Configurations of Si Buffer Layer Using X-ray Reflectometry and X-ray Standing Wave Methods. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Seregin%2C+A%2E+Yu%2E%22">Seregin, A. Yu.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Volkovsky%2C+Yu%2E+A%2E%22">Volkovsky, Yu. A.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> irlandez08@yandex.ru</i><br /><searchLink fieldCode="AR" term="%22Prosekov%2C+P%2E+A%2E%22">Prosekov, P. A.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kardeev%2C+Y%2E+D%2E%22">Kardeev, Y. D.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Polkovnikov%2C+V%2E+N%2E%22">Polkovnikov, V. N.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Smertin%2C+R%2E+M%2E%22">Smertin, R. M.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pisarevsky%2C+Yu%2E+V%2E%22">Pisarevsky, Yu. V.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Blagov%2C+A%2E+E%2E%22">Blagov, A. E.</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Crystallography+Reports%22">Crystallography Reports</searchLink>. Dec2025, Vol. 70 Issue 6, p872-877. 6p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22X-ray+reflectometry%22">X-ray reflectometry</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+mirrors%22">Optical mirrors</searchLink><br /><searchLink fieldCode="DE" term="%22Reflectometry%22">Reflectometry</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+detection%22">X-ray detection</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+multilayers%22">Optical multilayers</searchLink><br /><searchLink fieldCode="DE" term="%22Buffer+layers%22">Buffer layers</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The results of studying the multilayer mirrors (periodic Ti/Ni structures with different configurations of Si buffer layer), which are promising in developing mirror optics for synchrotron radiation, are presented. Samples with period structures Ti/Ni, Ti/Si/Ni, Ti/Ni/Si, and Ti/Si/Ni/Si were investigated by X-ray reflectometry and X-ray standing wave (XSW) methods. It is found that the Ti/Ni system is characterized by the largest thicknesses of transition layers at the Ti/Ni interfaces. Addition of Si interlayers between Ti and Ni layers leads to a decrease in the transition layer thicknesses, while addition of Si only within a period or only between periods leads to asymmetry of electron density profiles and elemental distribution profiles over the structure depth. It is shown that the structure with a Si buffer layer both between layers within a period and between the periods themselves (Ti/Si/Ni/Si) is an optimal mirror configuration in terms of reflectometry intensity. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1134/S1063774525601546 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 872 Subjects: – SubjectFull: X-ray reflectometry Type: general – SubjectFull: Optical mirrors Type: general – SubjectFull: Reflectometry Type: general – SubjectFull: X-ray detection Type: general – SubjectFull: Optical multilayers Type: general – SubjectFull: Buffer layers Type: general Titles: – TitleFull: X-ray Diagnostics of Multilayer Ti/Ni Mirrors with Different Configurations of Si Buffer Layer Using X-ray Reflectometry and X-ray Standing Wave Methods. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Seregin, A. Yu. – PersonEntity: Name: NameFull: Volkovsky, Yu. A. – PersonEntity: Name: NameFull: Prosekov, P. A. – PersonEntity: Name: NameFull: Kardeev, Y. D. – PersonEntity: Name: NameFull: Polkovnikov, V. N. – PersonEntity: Name: NameFull: Smertin, R. M. – PersonEntity: Name: NameFull: Pisarevsky, Yu. V. – PersonEntity: Name: NameFull: Blagov, A. E. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 12 Text: Dec2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 10637745 Numbering: – Type: volume Value: 70 – Type: issue Value: 6 Titles: – TitleFull: Crystallography Reports Type: main |
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