APA (7th ed.) Citation

Chibane, L., Delvallée, A., Fleurence, N., Douri, S., Morán-Meza, J., Ulysse, C., . . . Flahaut, E. (2025). Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study—Sample Preparation and Stability Issues. Nanomaterials (2079-4991), 15(24), 1861. https://doi.org/10.3390/nano15241861

Chicago Style (17th ed.) Citation

Chibane, Lydia, Alexandra Delvallée, Nolwenn Fleurence, Sarah Douri, José Morán-Meza, Christian Ulysse, François Piquemal, Nicolas Feltin, and Emmanuel Flahaut. "Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study—Sample Preparation and Stability Issues." Nanomaterials (2079-4991) 15, no. 24 (2025): 1861. https://doi.org/10.3390/nano15241861.

MLA (9th ed.) Citation

Chibane, Lydia, et al. "Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study—Sample Preparation and Stability Issues." Nanomaterials (2079-4991), vol. 15, no. 24, 2025, p. 1861, https://doi.org/10.3390/nano15241861.