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Design of guard band chart based on measurement uncertainty: a worker-centric experimental approach using CMM.

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Title: Design of guard band chart based on measurement uncertainty: a worker-centric experimental approach using CMM.
Authors: Choi, Insoo1 (AUTHOR), Hur, Sun1 (AUTHOR) hursun@hanyang.ac.kr
Source: Journal of Mechanical Science & Technology. Jan2026, Vol. 40 Issue 1, p533-548. 16p.
Subjects: Measurement uncertainty (Statistics), Quality control charts, Total quality management, Semiconductors, Applied sciences, Coordinate measuring machines
Abstract: This study aims to explore methods for understanding and practically applying measurement uncertainty in industrial settings. The limitations of conventional control charts in adequately reflecting measurement uncertainty were identified, highlighting the need for new management tools to address these shortcomings. Using a coordinate measuring machine (CMM), the flatness of semiconductor components was measured, and detailed procedures for estimating measurement uncertainty were presented. Based on this, a guard band chart (GBC) incorporating measurement uncertainty was designed, and its applicability was examined through experiments. The GBC was developed to visualize tolerance limits in real-time, integrate measurement uncertainty into quality management, and support operator responses to quality deviations. This study focuses on addressing the limitations of conventional control charts and proposes a structured approach to incorporating measurement uncertainty into quality management practices. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Mechanical Science & Technology is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 190982749
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Design of guard band chart based on measurement uncertainty: a worker-centric experimental approach using CMM.
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  Data: <searchLink fieldCode="AR" term="%22Choi%2C+Insoo%22">Choi, Insoo</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Hur%2C+Sun%22">Hur, Sun</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> hursun@hanyang.ac.kr</i>
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  Data: <searchLink fieldCode="DE" term="%22Measurement+uncertainty+%28Statistics%29%22">Measurement uncertainty (Statistics)</searchLink><br /><searchLink fieldCode="DE" term="%22Quality+control+charts%22">Quality control charts</searchLink><br /><searchLink fieldCode="DE" term="%22Total+quality+management%22">Total quality management</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductors%22">Semiconductors</searchLink><br /><searchLink fieldCode="DE" term="%22Applied+sciences%22">Applied sciences</searchLink><br /><searchLink fieldCode="DE" term="%22Coordinate+measuring+machines%22">Coordinate measuring machines</searchLink>
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  Label: Abstract
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  Data: This study aims to explore methods for understanding and practically applying measurement uncertainty in industrial settings. The limitations of conventional control charts in adequately reflecting measurement uncertainty were identified, highlighting the need for new management tools to address these shortcomings. Using a coordinate measuring machine (CMM), the flatness of semiconductor components was measured, and detailed procedures for estimating measurement uncertainty were presented. Based on this, a guard band chart (GBC) incorporating measurement uncertainty was designed, and its applicability was examined through experiments. The GBC was developed to visualize tolerance limits in real-time, integrate measurement uncertainty into quality management, and support operator responses to quality deviations. This study focuses on addressing the limitations of conventional control charts and proposes a structured approach to incorporating measurement uncertainty into quality management practices. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Journal of Mechanical Science & Technology is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s12206-025-1244-8
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        Text: English
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      – SubjectFull: Quality control charts
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      – SubjectFull: Total quality management
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      – SubjectFull: Semiconductors
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      – SubjectFull: Applied sciences
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      – SubjectFull: Coordinate measuring machines
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              Text: Jan2026
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              Y: 2026
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