Codegoni, D., Carnevale, G., De Marco, C., Mica, I., & Polignano, M. (2005). Leakage current and deep levels in CoSi2 silicided junctions. Materials Science & Engineering: B, 124-125, 349. https://doi.org/10.1016/j.mseb.2005.08.125
Chicago Style (17th ed.) CitationCodegoni, D., G.P Carnevale, C. De Marco, I. Mica, and M.L Polignano. "Leakage Current and Deep Levels in CoSi2 Silicided Junctions." Materials Science & Engineering: B 124-125 (2005): 349. https://doi.org/10.1016/j.mseb.2005.08.125.
MLA (9th ed.) CitationCodegoni, D., et al. "Leakage Current and Deep Levels in CoSi2 Silicided Junctions." Materials Science & Engineering: B, vol. 124-125, 2005, p. 349, https://doi.org/10.1016/j.mseb.2005.08.125.
Warning: These citations may not always be 100% accurate.