Thermoluminescence spectra of natural irradiated by 10MeV electrons
Saved in:
| Title: | Thermoluminescence spectra of natural irradiated by 10MeV electrons |
|---|---|
| Authors: | Manrique, J.1 jamanros@ceu.es, Angulo, S.1, Pardo, M.P.2, Gastesi, R.1, De la Cruz, A.1, Pérez, A.1 |
| Source: | Radiation Measurements. Feb2006, Vol. 41 Issue 2, p145-153. 9p. |
| Subjects: | Particles (Nuclear physics), Spectrum analysis, Mass spectrometry, Electrons |
| Abstract: | Abstract: The spectra of thermoluminescence from natural and electron-irradiated fluorite in the 350–800nm spectral range were studied between room temperature and 500°C. The sample came from Asturias (Spain) and was analyzed by X-ray diffractometry and inductively coupled plasma-mass spectrometry. Glow peaks appeared at 115, 205 and 310°C. Main emissions occurred at 475, 575, 650 and 745nm, attributed to the ion and, at 410nm, from electron–hole recombination. The fractional glow technique and the general order model were employed to study the emission at 575nm in detail. The results showed that the 115 and 205°C glow peaks originate at traps with activation energies of 1.6 and 1.9eV, respectively, on the kinetic order of 1.5 and 1.3 and frequency factors of and , respectively. Spectrally resolved fading produced by storage was observed, and we concluded that the emission was due to large defect complexes. The dosimetric study showed that there was saturation at doses higher than 2kGy. [Copyright &y& Elsevier] |
| Copyright of Radiation Measurements is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
Be the first to leave a comment!
