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'Irradiation‐Free' Work‐Function Measurements in XPS.

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Title: 'Irradiation‐Free' Work‐Function Measurements in XPS.
Authors: Cohen, Hagai1 (AUTHOR) hagai.cohen@weizmann.ac.il
Source: Surface & Interface Analysis: SIA. Mar2026, Vol. 58 Issue 3, p186-192. 7p.
Subjects: X-ray photoelectron spectroscopy, Electron work function, Surface analysis, Electric insulators & insulation, Nonmetallic materials, Irradiation
Abstract: A method for improved work‐function measurements in‐situ to X‐ray photoelectron spectroscopy (XPS) is presented. The method is based on the combination of two techniques involving irradiation each, however with opposite irradiation artifacts. Results can thus be processed to provide work‐function values of high reliability. An estimate of the (systematic) error in each measuring technique is obtained as well. Thus, application to poorly conducting specimens and insulators is enabled, with which the extent and reliability of XPS‐derived information can be improved significantly, starting from the standard chemical analysis and ending in novel XPS‐based electrical characterizations. [ABSTRACT FROM AUTHOR]
Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 191376443
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: 'Irradiation‐Free' Work‐Function Measurements in XPS.
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  Data: <searchLink fieldCode="AR" term="%22Cohen%2C+Hagai%22">Cohen, Hagai</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> hagai.cohen@weizmann.ac.il</i>
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  Data: <searchLink fieldCode="JN" term="%22Surface+%26+Interface+Analysis%3A+SIA%22">Surface & Interface Analysis: SIA</searchLink>. Mar2026, Vol. 58 Issue 3, p186-192. 7p.
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  Data: <searchLink fieldCode="DE" term="%22X-ray+photoelectron+spectroscopy%22">X-ray photoelectron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+work+function%22">Electron work function</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+analysis%22">Surface analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+insulators+%26+insulation%22">Electric insulators & insulation</searchLink><br /><searchLink fieldCode="DE" term="%22Nonmetallic+materials%22">Nonmetallic materials</searchLink><br /><searchLink fieldCode="DE" term="%22Irradiation%22">Irradiation</searchLink>
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  Data: A method for improved work‐function measurements in‐situ to X‐ray photoelectron spectroscopy (XPS) is presented. The method is based on the combination of two techniques involving irradiation each, however with opposite irradiation artifacts. Results can thus be processed to provide work‐function values of high reliability. An estimate of the (systematic) error in each measuring technique is obtained as well. Thus, application to poorly conducting specimens and insulators is enabled, with which the extent and reliability of XPS‐derived information can be improved significantly, starting from the standard chemical analysis and ending in novel XPS‐based electrical characterizations. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1002/sia.70045
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 186
    Subjects:
      – SubjectFull: X-ray photoelectron spectroscopy
        Type: general
      – SubjectFull: Electron work function
        Type: general
      – SubjectFull: Surface analysis
        Type: general
      – SubjectFull: Electric insulators & insulation
        Type: general
      – SubjectFull: Nonmetallic materials
        Type: general
      – SubjectFull: Irradiation
        Type: general
    Titles:
      – TitleFull: 'Irradiation‐Free' Work‐Function Measurements in XPS.
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            NameFull: Cohen, Hagai
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          Dates:
            – D: 01
              M: 03
              Text: Mar2026
              Type: published
              Y: 2026
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              Value: 58
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            – TitleFull: Surface & Interface Analysis: SIA
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