Development of a non-destructive elemental analysis method for sub-percent components using muon-induced gamma-rays. - Inagaki, Makoto; Ninomiya, Kazuhiko; Yoshida, Go; Kubo, Michael Kenya; Yakushi, Kosei; Watanabe, Eisuke; Nakada, Hiroki; Umegaki, Izumi (Journal of Radioanalytical & Nuclear Chemistry, 2026)