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Lateral structural variations in thin cellulose layers investigated by microbeam grazing incidence small-angle X-ray scattering

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Title: Lateral structural variations in thin cellulose layers investigated by microbeam grazing incidence small-angle X-ray scattering
Authors: Roth, S.V.1 sroth@esrf.fr, Artus, G.R.J.2, Rankl, M.2, Seeger, S.2, Burghammer, M.3, Riekel, C.3, Müller-Buschbaum, P.4
Source: Physica B. Feb2005, Vol. 357 Issue 1/2, p190-192. 3p.
Subjects: X-ray scattering, Surfaces (Technology), Atomic force microscopy, Scanning probe microscopy, Glucans
Abstract: Abstract: The Langmuir–Blodgett technique is a powerful tool to obtain large-scale thin films. We investigate a thin layer of modified cellulose by atomic force microscopy and microbeam grazing-incidence small angle X-ray scattering. We probe the lateral nanostructure of the as-prepared cellulose layer. The results indicate a lateral structural variation in the arrangement of the cellulose molecules parallel to the dipping direction. These variations occur on a length scale on the order of . [Copyright &y& Elsevier]
Copyright of Physica B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 19181242
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Lateral structural variations in thin cellulose layers investigated by microbeam grazing incidence small-angle X-ray scattering
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  Data: <searchLink fieldCode="AR" term="%22Roth%2C+S%2EV%2E%22">Roth, S.V.</searchLink><relatesTo>1</relatesTo><i> sroth@esrf.fr</i><br /><searchLink fieldCode="AR" term="%22Artus%2C+G%2ER%2EJ%2E%22">Artus, G.R.J.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Rankl%2C+M%2E%22">Rankl, M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Seeger%2C+S%2E%22">Seeger, S.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Burghammer%2C+M%2E%22">Burghammer, M.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Riekel%2C+C%2E%22">Riekel, C.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Müller-Buschbaum%2C+P%2E%22">Müller-Buschbaum, P.</searchLink><relatesTo>4</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Physica+B%22">Physica B</searchLink>. Feb2005, Vol. 357 Issue 1/2, p190-192. 3p.
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  Data: <searchLink fieldCode="DE" term="%22X-ray+scattering%22">X-ray scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Surfaces+%28Technology%29%22">Surfaces (Technology)</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+probe+microscopy%22">Scanning probe microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Glucans%22">Glucans</searchLink>
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  Label: Abstract
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  Data: Abstract: The Langmuir–Blodgett technique is a powerful tool to obtain large-scale thin films. We investigate a thin layer of modified cellulose by atomic force microscopy and microbeam grazing-incidence small angle X-ray scattering. We probe the lateral nanostructure of the as-prepared cellulose layer. The results indicate a lateral structural variation in the arrangement of the cellulose molecules parallel to the dipping direction. These variations occur on a length scale on the order of . [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Physica B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.physb.2004.11.054
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        Text: English
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      – SubjectFull: Surfaces (Technology)
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      – SubjectFull: Atomic force microscopy
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              Text: Feb2005
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