Half Logistic - Pareto Distribution in Acceptance Sampling Plans Based on Truncated Life Tests.

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Bibliographic Details
Title: Half Logistic - Pareto Distribution in Acceptance Sampling Plans Based on Truncated Life Tests.
Authors: Prakash, S. Bhanu1 prakash9293165890@gmail.com, Jilani, Sd.2 jilanisyed1992@gmail.com, Latha, D. Madhu3 koppisittemadhulatha@gmail.com, Purnima, D. Naga1 munukutla1977@gmail.com, Sailaja, V. Lakshmi1 sailajavaradhi@gmail.com
Source: IAENG International Journal of Applied Mathematics. Mar2026, Vol. 56 Issue 3, p1051-1057. 7p.
Subjects: Acceptance sampling, Pareto distribution, Quality control, Accelerated life testing, False positive error, Sample size (Statistics)
Abstract: This paper proposes an innovative acceptance sampling plan under a truncated life test framework, assuming that the lifetime of a product follows a Half Logistic-Pareto Distribution (HLPD). For different acceptance numbers, confidence levels, and ratios of test duration to the true mean lifetime, the minimum required sample sizes are determined to validate the specified mean life. The corresponding operating characteristic (OC) values and producer's risk associated with the proposed plan are also evaluated. Comprehensive tables are provided, and the plan's performance is illustrated and interpreted through detailed numerical examples. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
Description
Abstract:This paper proposes an innovative acceptance sampling plan under a truncated life test framework, assuming that the lifetime of a product follows a Half Logistic-Pareto Distribution (HLPD). For different acceptance numbers, confidence levels, and ratios of test duration to the true mean lifetime, the minimum required sample sizes are determined to validate the specified mean life. The corresponding operating characteristic (OC) values and producer's risk associated with the proposed plan are also evaluated. Comprehensive tables are provided, and the plan's performance is illustrated and interpreted through detailed numerical examples. [ABSTRACT FROM AUTHOR]
ISSN:19929978