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Defocused illumination with beam‐shaping condenser for uniform wide‐field X‐ray imaging.

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Title: Defocused illumination with beam‐shaping condenser for uniform wide‐field X‐ray imaging.
Authors: Zhang, Kuanqiang1 (AUTHOR), Luo, Yijue1 (AUTHOR), Di, Yunfan1 (AUTHOR), Guo, Chenfei1 (AUTHOR), Li, Changhao1 (AUTHOR), He, Menghui1 (AUTHOR), Zhang, Chao1 (AUTHOR), Peng, Fangfang1,2 (AUTHOR), Liu, Wen3 (AUTHOR), Wu, Zhao1 (AUTHOR), Guan, Yong1 (AUTHOR), Tian, Yangchao1 (AUTHOR), Liu, Gang1 (AUTHOR) liugang@ustc.edu.cn
Source: Journal of Synchrotron Radiation. Mar2026, Vol. 33 Issue 2, p429-436. 8p.
Subjects: X-ray microscopy, Diffraction patterns, Light sources, Radiance, Fresnel diffraction, Soft X rays, Imaging systems
Abstract: The beam‐shaping condenser (BSC) has become a key optical component in X‐ray microscopy, providing a wide field of view with stable and uniform illumination. However, alternating bright and dark fringes often appear at the focal spot, compromising illumination uniformity. To elucidate the formation mechanism of these diffraction fringes, this study conducted theoretical analyses and numerical simulations. Based on this, a defocused illumination approach was developed to alter the focal positions and spatial relative phases of the sub‐gratings, thereby enhancing illumination uniformity. The influence of defocused illumination on fringe patterns and intensity distribution was systematically investigated. To validate this approach, a BSC with a Fresnel number of 20 and a 60 µm × 60 µm field of view was fabricated and tested at the soft X‐ray imaging beamline of the Hefei Light Source. Experimental results demonstrate that the device achieves uniform top‐hat illumination across the full field, effectively suppressing diffraction‐induced artifacts. This work offers an efficient and practical approach for achieving wide‐field uniform illumination in X‐ray microscopy. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Defocused illumination with beam‐shaping condenser for uniform wide‐field X‐ray imaging.
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  Data: <searchLink fieldCode="AR" term="%22Zhang%2C+Kuanqiang%22">Zhang, Kuanqiang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Luo%2C+Yijue%22">Luo, Yijue</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Di%2C+Yunfan%22">Di, Yunfan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Guo%2C+Chenfei%22">Guo, Chenfei</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Li%2C+Changhao%22">Li, Changhao</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22He%2C+Menghui%22">He, Menghui</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Chao%22">Zhang, Chao</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Peng%2C+Fangfang%22">Peng, Fangfang</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Liu%2C+Wen%22">Liu, Wen</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wu%2C+Zhao%22">Wu, Zhao</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Guan%2C+Yong%22">Guan, Yong</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tian%2C+Yangchao%22">Tian, Yangchao</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Liu%2C+Gang%22">Liu, Gang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> liugang@ustc.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. Mar2026, Vol. 33 Issue 2, p429-436. 8p.
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  Data: <searchLink fieldCode="DE" term="%22X-ray+microscopy%22">X-ray microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Diffraction+patterns%22">Diffraction patterns</searchLink><br /><searchLink fieldCode="DE" term="%22Light+sources%22">Light sources</searchLink><br /><searchLink fieldCode="DE" term="%22Radiance%22">Radiance</searchLink><br /><searchLink fieldCode="DE" term="%22Fresnel+diffraction%22">Fresnel diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Soft+X+rays%22">Soft X rays</searchLink><br /><searchLink fieldCode="DE" term="%22Imaging+systems%22">Imaging systems</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The beam‐shaping condenser (BSC) has become a key optical component in X‐ray microscopy, providing a wide field of view with stable and uniform illumination. However, alternating bright and dark fringes often appear at the focal spot, compromising illumination uniformity. To elucidate the formation mechanism of these diffraction fringes, this study conducted theoretical analyses and numerical simulations. Based on this, a defocused illumination approach was developed to alter the focal positions and spatial relative phases of the sub‐gratings, thereby enhancing illumination uniformity. The influence of defocused illumination on fringe patterns and intensity distribution was systematically investigated. To validate this approach, a BSC with a Fresnel number of 20 and a 60 µm × 60 µm field of view was fabricated and tested at the soft X‐ray imaging beamline of the Hefei Light Source. Experimental results demonstrate that the device achieves uniform top‐hat illumination across the full field, effectively suppressing diffraction‐induced artifacts. This work offers an efficient and practical approach for achieving wide‐field uniform illumination in X‐ray microscopy. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1107/S1600577525011373
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 429
    Subjects:
      – SubjectFull: X-ray microscopy
        Type: general
      – SubjectFull: Diffraction patterns
        Type: general
      – SubjectFull: Light sources
        Type: general
      – SubjectFull: Radiance
        Type: general
      – SubjectFull: Fresnel diffraction
        Type: general
      – SubjectFull: Soft X rays
        Type: general
      – SubjectFull: Imaging systems
        Type: general
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      – TitleFull: Defocused illumination with beam‐shaping condenser for uniform wide‐field X‐ray imaging.
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              Text: Mar2026
              Type: published
              Y: 2026
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