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High‐throughput X‐ray total scattering measurement system at BL04B2 of SPring‐8.

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Title: High‐throughput X‐ray total scattering measurement system at BL04B2 of SPring‐8.
Authors: Yamada, Hiroki1 (AUTHOR) h_yamada@spring8.or.jp, Shimono, Seiya1 (AUTHOR), Kawaguchi, Shogo1 (AUTHOR), Ohara, Koji1,2 (AUTHOR), Watanabe, Kei1 (AUTHOR), Takemoto, Michitaka1 (AUTHOR), Tseng, Jo-chi1 (AUTHOR), Takahashi, Masakuni1,3 (AUTHOR), Sada, Yuki1 (AUTHOR), Yamazaki, Hiroshi1,4 (AUTHOR), Ohashi, Haruhiko1,4 (AUTHOR), Imai, Yasuhiko1,4 (AUTHOR), Hatsui, Takaki1,4 (AUTHOR), Inoue, Ichiro4 (AUTHOR), Kimura, Shigeru1 (AUTHOR), Sugimoto, Kunihisa1,5 (AUTHOR), Yabashi, Makina1,4 (AUTHOR), Sakata, Osami1 (AUTHOR), Higo, Yuji1 (AUTHOR), Tamasaku, Kenji1,4 (AUTHOR)
Source: Journal of Synchrotron Radiation. Mar2026, Vol. 33 Issue 2, p516-522. 7p.
Subjects: X-ray scattering, Structural analysis (Science), Temperature control, Materials analysis, Monochromators, Diffractometers, X-ray detection, Measuring instruments
Abstract: X‐ray total scattering is widely used for analyzing pair distribution functions (PDFs) to elucidate the local structure of materials. For achieving high‐throughput PDF analysis, a beamline monochromator and an experimental system were updated at BL04B2 of SPring‐8. The system consists of a diffractometer and 2D area detectors, which cover a wide Q range of 0.2–27 Å−1 at a photon energy of 113 keV, with a temperature control capability between 100 and 1100 K. The typical measurement time is reduced to ∼10 min per sample, which is more than ten times faster than the conventional setup. This system enables efficient structural analysis of various types of materials such as liquids, glasses and nanocrystals while yielding abundant measurement data for use in materials science. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: High‐throughput X‐ray total scattering measurement system at BL04B2 of SPring‐8.
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  Data: <searchLink fieldCode="AR" term="%22Yamada%2C+Hiroki%22">Yamada, Hiroki</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> h_yamada@spring8.or.jp</i><br /><searchLink fieldCode="AR" term="%22Shimono%2C+Seiya%22">Shimono, Seiya</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kawaguchi%2C+Shogo%22">Kawaguchi, Shogo</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ohara%2C+Koji%22">Ohara, Koji</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Watanabe%2C+Kei%22">Watanabe, Kei</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Takemoto%2C+Michitaka%22">Takemoto, Michitaka</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tseng%2C+Jo-chi%22">Tseng, Jo-chi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Takahashi%2C+Masakuni%22">Takahashi, Masakuni</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sada%2C+Yuki%22">Sada, Yuki</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yamazaki%2C+Hiroshi%22">Yamazaki, Hiroshi</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ohashi%2C+Haruhiko%22">Ohashi, Haruhiko</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Imai%2C+Yasuhiko%22">Imai, Yasuhiko</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Hatsui%2C+Takaki%22">Hatsui, Takaki</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Inoue%2C+Ichiro%22">Inoue, Ichiro</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kimura%2C+Shigeru%22">Kimura, Shigeru</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sugimoto%2C+Kunihisa%22">Sugimoto, Kunihisa</searchLink><relatesTo>1,5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yabashi%2C+Makina%22">Yabashi, Makina</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sakata%2C+Osami%22">Sakata, Osami</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Higo%2C+Yuji%22">Higo, Yuji</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tamasaku%2C+Kenji%22">Tamasaku, Kenji</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. Mar2026, Vol. 33 Issue 2, p516-522. 7p.
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  Data: <searchLink fieldCode="DE" term="%22X-ray+scattering%22">X-ray scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Structural+analysis+%28Science%29%22">Structural analysis (Science)</searchLink><br /><searchLink fieldCode="DE" term="%22Temperature+control%22">Temperature control</searchLink><br /><searchLink fieldCode="DE" term="%22Materials+analysis%22">Materials analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Monochromators%22">Monochromators</searchLink><br /><searchLink fieldCode="DE" term="%22Diffractometers%22">Diffractometers</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+detection%22">X-ray detection</searchLink><br /><searchLink fieldCode="DE" term="%22Measuring+instruments%22">Measuring instruments</searchLink>
– Name: Abstract
  Label: Abstract
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  Data: X‐ray total scattering is widely used for analyzing pair distribution functions (PDFs) to elucidate the local structure of materials. For achieving high‐throughput PDF analysis, a beamline monochromator and an experimental system were updated at BL04B2 of SPring‐8. The system consists of a diffractometer and 2D area detectors, which cover a wide Q range of 0.2–27 Å−1 at a photon energy of 113 keV, with a temperature control capability between 100 and 1100 K. The typical measurement time is reduced to ∼10 min per sample, which is more than ten times faster than the conventional setup. This system enables efficient structural analysis of various types of materials such as liquids, glasses and nanocrystals while yielding abundant measurement data for use in materials science. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1107/S1600577525011294
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        Text: English
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      – SubjectFull: X-ray scattering
        Type: general
      – SubjectFull: Structural analysis (Science)
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      – SubjectFull: Temperature control
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      – SubjectFull: X-ray detection
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              Text: Mar2026
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