Beyond Point-like Defects in Bulk Semiconductors: Junction Spectroscopy Techniques for Perovskite Solar Cells and 2D Materials.

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Title: Beyond Point-like Defects in Bulk Semiconductors: Junction Spectroscopy Techniques for Perovskite Solar Cells and 2D Materials.
Authors: Capan, Ivana1 (AUTHOR)
Source: Nanomaterials (2079-4991). Mar2026, Vol. 16 Issue 6, p350. 20p.
Subjects: Semiconductor defects, Semiconductor junctions, Solar cells, Two-dimensional materials (Nanotechnology), Semiconductor devices, Semiconductors
Abstract: Junction spectroscopy techniques (JSTs) are powerful tools for investigating electrically active defects in semiconductors. Originally developed to study point-like defects in bulk semiconductors, JSTs have since been extended to increasingly complex systems, providing valuable insights into defect energetics and interactions. This review paper outlines the fundamental principles of JSTs and critically examines their application to emerging materials, such as perovskite solar cells and two-dimensional (2D) materials. By highlighting both the capabilities and limitations of JSTs in these non-classical systems, the review demonstrates their continued relevance and important role in advancing next-generation semiconductor materials and devices. [ABSTRACT FROM AUTHOR]
Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Label: Title
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  Data: Beyond Point-like Defects in Bulk Semiconductors: Junction Spectroscopy Techniques for Perovskite Solar Cells and 2D Materials.
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  Data: <searchLink fieldCode="AR" term="%22Capan%2C+Ivana%22">Capan, Ivana</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Nanomaterials+%282079-4991%29%22">Nanomaterials (2079-4991)</searchLink>. Mar2026, Vol. 16 Issue 6, p350. 20p.
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  Data: <searchLink fieldCode="DE" term="%22Semiconductor+defects%22">Semiconductor defects</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductor+junctions%22">Semiconductor junctions</searchLink><br /><searchLink fieldCode="DE" term="%22Solar+cells%22">Solar cells</searchLink><br /><searchLink fieldCode="DE" term="%22Two-dimensional+materials+%28Nanotechnology%29%22">Two-dimensional materials (Nanotechnology)</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductor+devices%22">Semiconductor devices</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductors%22">Semiconductors</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Junction spectroscopy techniques (JSTs) are powerful tools for investigating electrically active defects in semiconductors. Originally developed to study point-like defects in bulk semiconductors, JSTs have since been extended to increasingly complex systems, providing valuable insights into defect energetics and interactions. This review paper outlines the fundamental principles of JSTs and critically examines their application to emerging materials, such as perovskite solar cells and two-dimensional (2D) materials. By highlighting both the capabilities and limitations of JSTs in these non-classical systems, the review demonstrates their continued relevance and important role in advancing next-generation semiconductor materials and devices. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.3390/nano16060350
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        Text: English
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        StartPage: 350
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      – SubjectFull: Semiconductor defects
        Type: general
      – SubjectFull: Semiconductor junctions
        Type: general
      – SubjectFull: Solar cells
        Type: general
      – SubjectFull: Two-dimensional materials (Nanotechnology)
        Type: general
      – SubjectFull: Semiconductor devices
        Type: general
      – SubjectFull: Semiconductors
        Type: general
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      – TitleFull: Beyond Point-like Defects in Bulk Semiconductors: Junction Spectroscopy Techniques for Perovskite Solar Cells and 2D Materials.
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              Text: Mar2026
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