Design of a π-Type Broadband Flat Negative Group Delay Circuit.

Saved in:
Bibliographic Details
Title: Design of a π-Type Broadband Flat Negative Group Delay Circuit.
Authors: Yuan, Aixia1, Feng, Zhiyang1, Liu, Junzheng2 junzheng.liu@dlssa.com, Meng, Yuwei1, Chang, Niannan1, Zhang, Hongjun1
Source: Progress in Electromagnetics Research C. 2026, Vol. 167, p32-38. 7p.
Subjects: Lumped elements, Electric circuits, Model validation, Microwave communication systems, Insertion loss (Telecommunication), Mathematical analysis
Abstract: This study proposes a novel π-type circuit topology designed to achieve broadband and flat negative group delay (NGD) characteristics. Featuring a simple structure composed entirely of passive lumped elements, the proposed design offers significant advantages in terms of ease of fabrication, low cost, and seamless integration into larger microwave systems. First, a comprehensive theoretical analysis was conducted to establish the operational principles and derive the design equations. We then systematically investigated the sensitivity of the circuit's performance to variations in individual component values, which provides crucial guidelines for practical implementation. To validate our theoretical findings, a physical prototype with compact dimensions of 32 mm x 35 mm was designed and fabricated. Experimental results demonstrate that at the center frequency of 107.5 MHz, the circuit achieves an NGD of -2.27 ns with an insertion loss of 19.5 dB. Notably, the circuit maintains a wide flat NGD bandwidth of 151 MHz, exhibiting a group delay fluctuation of merely 4.1% across the band. These results confirm the effectiveness and robustness of the proposed circuit for broadband microwave applications. [ABSTRACT FROM AUTHOR]
Copyright of Progress in Electromagnetics Research C is the property of Electromagnetics Academy and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Be the first to leave a comment!
You must be logged in first