LaueMatching: an approach for rapid and robust indexing of Laue diffraction patterns.
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| Title: | LaueMatching: an approach for rapid and robust indexing of Laue diffraction patterns. |
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| Authors: | Sharma, Hemant1 (AUTHOR) hsharma@anl.gov, Sheyfer, Dina1 (AUTHOR), Harder, Ross1 (AUTHOR), Tischler, Jonathan Z.1 (AUTHOR) |
| Source: | Journal of Applied Crystallography. Apr2026, Vol. 59 Issue 2, p552-563. 12p. |
| Subjects: | Pattern matching, Crystal orientation, Electronic data processing, Algorithms, X-ray diffraction, Image processing, Computer simulation, Crystallography |
| Abstract: | Traditional Laue diffraction pattern indexing often struggles with noisy data, weak signals, peak overlap and missing reflections, particularly from complex or deformed microstructures. Here, we introduce LaueMatching, a high‐throughput indexing algorithm designed to overcome these limitations. LaueMatching utilizes a fundamentally different approach based on direct pattern correlation: experimentally pre‐processed images are compared against a comprehensive pre‐computed library of simulated diffraction patterns corresponding to a dense grid of possible orientations. This approach bypasses the need for explicit peak identification and fitting, steps that are often a failure point for traditional methods. The algorithm rapidly and robustly indexes multiple crystallographic orientations and crystal systems simultaneously, even from challenging patterns. LaueMatching's effectiveness and accuracy have been rigorously tested and validated on diverse experimental (Ni, Al, EuAl2O4) and simulated diffraction patterns, demonstrating high‐fidelity orientation refinement. Code to implement this approach on both CPU and GPU resources can be downloaded from https://github.com/AdvancedPhotonSource/LaueMatching. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 192849687 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: LaueMatching: an approach for rapid and robust indexing of Laue diffraction patterns. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Sharma%2C+Hemant%22">Sharma, Hemant</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> hsharma@anl.gov</i><br /><searchLink fieldCode="AR" term="%22Sheyfer%2C+Dina%22">Sheyfer, Dina</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Harder%2C+Ross%22">Harder, Ross</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tischler%2C+Jonathan+Z%2E%22">Tischler, Jonathan Z.</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Crystallography%22">Journal of Applied Crystallography</searchLink>. Apr2026, Vol. 59 Issue 2, p552-563. 12p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Pattern+matching%22">Pattern matching</searchLink><br /><searchLink fieldCode="DE" term="%22Crystal+orientation%22">Crystal orientation</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+data+processing%22">Electronic data processing</searchLink><br /><searchLink fieldCode="DE" term="%22Algorithms%22">Algorithms</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Image+processing%22">Image processing</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+simulation%22">Computer simulation</searchLink><br /><searchLink fieldCode="DE" term="%22Crystallography%22">Crystallography</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Traditional Laue diffraction pattern indexing often struggles with noisy data, weak signals, peak overlap and missing reflections, particularly from complex or deformed microstructures. Here, we introduce LaueMatching, a high‐throughput indexing algorithm designed to overcome these limitations. LaueMatching utilizes a fundamentally different approach based on direct pattern correlation: experimentally pre‐processed images are compared against a comprehensive pre‐computed library of simulated diffraction patterns corresponding to a dense grid of possible orientations. This approach bypasses the need for explicit peak identification and fitting, steps that are often a failure point for traditional methods. The algorithm rapidly and robustly indexes multiple crystallographic orientations and crystal systems simultaneously, even from challenging patterns. LaueMatching's effectiveness and accuracy have been rigorously tested and validated on diverse experimental (Ni, Al, EuAl2O4) and simulated diffraction patterns, demonstrating high‐fidelity orientation refinement. Code to implement this approach on both CPU and GPU resources can be downloaded from https://github.com/AdvancedPhotonSource/LaueMatching. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1107/S1600576726001196 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 552 Subjects: – SubjectFull: Pattern matching Type: general – SubjectFull: Crystal orientation Type: general – SubjectFull: Electronic data processing Type: general – SubjectFull: Algorithms Type: general – SubjectFull: X-ray diffraction Type: general – SubjectFull: Image processing Type: general – SubjectFull: Computer simulation Type: general – SubjectFull: Crystallography Type: general Titles: – TitleFull: LaueMatching: an approach for rapid and robust indexing of Laue diffraction patterns. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Sharma, Hemant – PersonEntity: Name: NameFull: Sheyfer, Dina – PersonEntity: Name: NameFull: Harder, Ross – PersonEntity: Name: NameFull: Tischler, Jonathan Z. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 00218898 Numbering: – Type: volume Value: 59 – Type: issue Value: 2 Titles: – TitleFull: Journal of Applied Crystallography Type: main |
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