Controllable Growth of Ordered In-Plane Ge Hut Wires on Trench-Patterned Si Substrate.
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| Title: | Controllable Growth of Ordered In-Plane Ge Hut Wires on Trench-Patterned Si Substrate. |
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| Authors: | Gao, Fei1,2 (AUTHOR) gaofei@qlit.edu.cn, Ming, Ming2 (AUTHOR), Zhang, Jie-Yin2,3 (AUTHOR), Zhang, Jian-Jun1,2 (AUTHOR) |
| Source: | Nanomaterials (2079-4991). Apr2026, Vol. 16 Issue 7, p423. 8p. |
| Subjects: | Synthesis of nanowires, Molecular beam epitaxy, Quantum electronics, Nanowires, Qubits, Substrates (Materials science), Buffer layers |
| Abstract: | The controllable growth of in-plane Ge nanowires provides alternative material foundations for the scalability of Ge-based semiconductor qubit devices. Here, ordered in-plane Ge hut wires with controllable size are grown on the trench-patterned Si substrate by molecular beam epitaxy. By tuning the thickness of the SiGe alloy layer, which acts as strain buffered layer, GeSi mounds with controllable size are achieved. Subsequently, through the deposition of a Ge layer followed by in situ annealing, we realize the size-controllable growth of the Ge nanowire with a height from 1.8 nm to 4.0 nm, as characterized by AFM and TEM techniques. These size-tunable and catalyst-free Ge hut wires provide a promising pathway toward the fabrication of integrated nanowire-based quantum devices. [ABSTRACT FROM AUTHOR] |
| Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
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| Header | DbId: egs DbLabel: Engineering Source An: 192960266 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Controllable Growth of Ordered In-Plane Ge Hut Wires on Trench-Patterned Si Substrate. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Gao%2C+Fei%22">Gao, Fei</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> gaofei@qlit.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Ming%2C+Ming%22">Ming, Ming</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Jie-Yin%22">Zhang, Jie-Yin</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Jian-Jun%22">Zhang, Jian-Jun</searchLink><relatesTo>1,2</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Nanomaterials+%282079-4991%29%22">Nanomaterials (2079-4991)</searchLink>. Apr2026, Vol. 16 Issue 7, p423. 8p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Synthesis+of+nanowires%22">Synthesis of nanowires</searchLink><br /><searchLink fieldCode="DE" term="%22Molecular+beam+epitaxy%22">Molecular beam epitaxy</searchLink><br /><searchLink fieldCode="DE" term="%22Quantum+electronics%22">Quantum electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Nanowires%22">Nanowires</searchLink><br /><searchLink fieldCode="DE" term="%22Qubits%22">Qubits</searchLink><br /><searchLink fieldCode="DE" term="%22Substrates+%28Materials+science%29%22">Substrates (Materials science)</searchLink><br /><searchLink fieldCode="DE" term="%22Buffer+layers%22">Buffer layers</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The controllable growth of in-plane Ge nanowires provides alternative material foundations for the scalability of Ge-based semiconductor qubit devices. Here, ordered in-plane Ge hut wires with controllable size are grown on the trench-patterned Si substrate by molecular beam epitaxy. By tuning the thickness of the SiGe alloy layer, which acts as strain buffered layer, GeSi mounds with controllable size are achieved. Subsequently, through the deposition of a Ge layer followed by in situ annealing, we realize the size-controllable growth of the Ge nanowire with a height from 1.8 nm to 4.0 nm, as characterized by AFM and TEM techniques. These size-tunable and catalyst-free Ge hut wires provide a promising pathway toward the fabrication of integrated nanowire-based quantum devices. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/nano16070423 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 423 Subjects: – SubjectFull: Synthesis of nanowires Type: general – SubjectFull: Molecular beam epitaxy Type: general – SubjectFull: Quantum electronics Type: general – SubjectFull: Nanowires Type: general – SubjectFull: Qubits Type: general – SubjectFull: Substrates (Materials science) Type: general – SubjectFull: Buffer layers Type: general Titles: – TitleFull: Controllable Growth of Ordered In-Plane Ge Hut Wires on Trench-Patterned Si Substrate. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Gao, Fei – PersonEntity: Name: NameFull: Ming, Ming – PersonEntity: Name: NameFull: Zhang, Jie-Yin – PersonEntity: Name: NameFull: Zhang, Jian-Jun IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 20794991 Numbering: – Type: volume Value: 16 – Type: issue Value: 7 Titles: – TitleFull: Nanomaterials (2079-4991) Type: main |
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