Controlled wrinkling of TiO2 thin films for nanostructure-induced antireflective surfaces.

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Bibliographic Details
Title: Controlled wrinkling of TiO2 thin films for nanostructure-induced antireflective surfaces.
Authors: Szymczak, Patryk1 (AUTHOR), Jeleń, Piotr1 (AUTHOR), Ziąbka, Magdalena1 (AUTHOR), Nocuń, Marek1 (AUTHOR), Handke, Bartosz1 (AUTHOR) bhandke@agh.edu.pl
Source: Journal of Materials Science. May2026, Vol. 61 Issue 19, p13066-13081. 16p.
Subjects: Antireflective coatings, Wrinkle patterns, Titanium dioxide films, Solar energy conversion, Nanostructures, X-ray diffraction, Ultrahigh vacuum, Raman spectroscopy
Abstract: This work reports a novel strategy for achieving antireflective properties through the fabrication of nanostructured TiO2 thin films by controlled wrinkling under ultra-high vacuum (UHV) conditions. The approach is based on a designed bilayer system consisting of a titanium dioxide (TiO2) coating deposited on a dodecaphenyl-POSS scaffold, which generates a well-defined wrinkled nanostructure with enhanced light-scattering capability. Structural characterization by Grazing Incidence X-ray Diffraction (GIXRD) and Raman spectroscopy confirmed the coexistence of anatase and rutile phases, as well as a clear phase transformation influenced by annealing temperature. Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) analyses further elucidated the evolution of surface morphology, revealing a systematic decrease in wrinkle density and amplitude with increasing annealing temperature and TiO2 thickness. Optical measurements demonstrated a significant reduction in reflectance, with over 58% improvement compared to bare silicon substrates. These results highlight the potential of nanostructure-induced surface modification to improve optical performance and provide a promising pathway for applications in solar energy conversion, photonic coatings, and other energy-related technologies. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
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Abstract:This work reports a novel strategy for achieving antireflective properties through the fabrication of nanostructured TiO2 thin films by controlled wrinkling under ultra-high vacuum (UHV) conditions. The approach is based on a designed bilayer system consisting of a titanium dioxide (TiO2) coating deposited on a dodecaphenyl-POSS scaffold, which generates a well-defined wrinkled nanostructure with enhanced light-scattering capability. Structural characterization by Grazing Incidence X-ray Diffraction (GIXRD) and Raman spectroscopy confirmed the coexistence of anatase and rutile phases, as well as a clear phase transformation influenced by annealing temperature. Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) analyses further elucidated the evolution of surface morphology, revealing a systematic decrease in wrinkle density and amplitude with increasing annealing temperature and TiO2 thickness. Optical measurements demonstrated a significant reduction in reflectance, with over 58% improvement compared to bare silicon substrates. These results highlight the potential of nanostructure-induced surface modification to improve optical performance and provide a promising pathway for applications in solar energy conversion, photonic coatings, and other energy-related technologies. [ABSTRACT FROM AUTHOR]
ISSN:00222461
DOI:10.1007/s10853-026-12653-8