Controlled wrinkling of TiO2 thin films for nanostructure-induced antireflective surfaces.

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Title: Controlled wrinkling of TiO2 thin films for nanostructure-induced antireflective surfaces.
Authors: Szymczak, Patryk1 (AUTHOR), Jeleń, Piotr1 (AUTHOR), Ziąbka, Magdalena1 (AUTHOR), Nocuń, Marek1 (AUTHOR), Handke, Bartosz1 (AUTHOR) bhandke@agh.edu.pl
Source: Journal of Materials Science. May2026, Vol. 61 Issue 19, p13066-13081. 16p.
Subjects: Antireflective coatings, Wrinkle patterns, Titanium dioxide films, Solar energy conversion, Nanostructures, X-ray diffraction, Ultrahigh vacuum, Raman spectroscopy
Abstract: This work reports a novel strategy for achieving antireflective properties through the fabrication of nanostructured TiO2 thin films by controlled wrinkling under ultra-high vacuum (UHV) conditions. The approach is based on a designed bilayer system consisting of a titanium dioxide (TiO2) coating deposited on a dodecaphenyl-POSS scaffold, which generates a well-defined wrinkled nanostructure with enhanced light-scattering capability. Structural characterization by Grazing Incidence X-ray Diffraction (GIXRD) and Raman spectroscopy confirmed the coexistence of anatase and rutile phases, as well as a clear phase transformation influenced by annealing temperature. Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) analyses further elucidated the evolution of surface morphology, revealing a systematic decrease in wrinkle density and amplitude with increasing annealing temperature and TiO2 thickness. Optical measurements demonstrated a significant reduction in reflectance, with over 58% improvement compared to bare silicon substrates. These results highlight the potential of nanostructure-induced surface modification to improve optical performance and provide a promising pathway for applications in solar energy conversion, photonic coatings, and other energy-related technologies. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Materials Science is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Controlled wrinkling of TiO<subscript>2</subscript> thin films for nanostructure-induced antireflective surfaces.
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  Data: <searchLink fieldCode="DE" term="%22Antireflective+coatings%22">Antireflective coatings</searchLink><br /><searchLink fieldCode="DE" term="%22Wrinkle+patterns%22">Wrinkle patterns</searchLink><br /><searchLink fieldCode="DE" term="%22Titanium+dioxide+films%22">Titanium dioxide films</searchLink><br /><searchLink fieldCode="DE" term="%22Solar+energy+conversion%22">Solar energy conversion</searchLink><br /><searchLink fieldCode="DE" term="%22Nanostructures%22">Nanostructures</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Ultrahigh+vacuum%22">Ultrahigh vacuum</searchLink><br /><searchLink fieldCode="DE" term="%22Raman+spectroscopy%22">Raman spectroscopy</searchLink>
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  Data: This work reports a novel strategy for achieving antireflective properties through the fabrication of nanostructured TiO2 thin films by controlled wrinkling under ultra-high vacuum (UHV) conditions. The approach is based on a designed bilayer system consisting of a titanium dioxide (TiO2) coating deposited on a dodecaphenyl-POSS scaffold, which generates a well-defined wrinkled nanostructure with enhanced light-scattering capability. Structural characterization by Grazing Incidence X-ray Diffraction (GIXRD) and Raman spectroscopy confirmed the coexistence of anatase and rutile phases, as well as a clear phase transformation influenced by annealing temperature. Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) analyses further elucidated the evolution of surface morphology, revealing a systematic decrease in wrinkle density and amplitude with increasing annealing temperature and TiO2 thickness. Optical measurements demonstrated a significant reduction in reflectance, with over 58% improvement compared to bare silicon substrates. These results highlight the potential of nanostructure-induced surface modification to improve optical performance and provide a promising pathway for applications in solar energy conversion, photonic coatings, and other energy-related technologies. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Materials Science is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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        Value: 10.1007/s10853-026-12653-8
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      – Code: eng
        Text: English
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        PageCount: 16
        StartPage: 13066
    Subjects:
      – SubjectFull: Antireflective coatings
        Type: general
      – SubjectFull: Wrinkle patterns
        Type: general
      – SubjectFull: Titanium dioxide films
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      – SubjectFull: Solar energy conversion
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      – SubjectFull: X-ray diffraction
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      – SubjectFull: Ultrahigh vacuum
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      – SubjectFull: Raman spectroscopy
        Type: general
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      – TitleFull: Controlled wrinkling of TiO2 thin films for nanostructure-induced antireflective surfaces.
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            NameFull: Szymczak, Patryk
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            NameFull: Jeleń, Piotr
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            NameFull: Ziąbka, Magdalena
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            NameFull: Nocuń, Marek
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              M: 05
              Text: May2026
              Type: published
              Y: 2026
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