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Correlating morphology and luminescence with SEM-CL: versatile applications from dynamics to heterogeneity.

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Title: Correlating morphology and luminescence with SEM-CL: versatile applications from dynamics to heterogeneity.
Authors: Jiang, Rongrong1 (AUTHOR) jiangrr@nimte.ac.cn, Hu, Kejia2 (AUTHOR), Yao, Yirong1 (AUTHOR), Li, Ming1 (AUTHOR), Ke, Peiling1 (AUTHOR)
Source: Journal of Materials Science. May2026, Vol. 61 Issue 20, p14074-14085. 12p.
Subjects: Scanning electron microscopes, Cathodoluminescence, Ceramics, Perovskite, Semiconductor materials, Optoelectronics, Hyperspectral imaging systems, Surface morphology
Abstract: Scanning electron microscope–cathodoluminescence (SEM-CL) integrates high-resolution morphology imaging with localized spectral analysis, offering a unique platform for correlating material structure with optoelectronic function. This work demonstrates the versatility of this correlative approach across distinct material systems. For unstable halide perovskites, in situ CL visualizes rapid degradation dynamics prior to morphological change. In complex AlN/AlGaN semiconductors, a hyperspectral imaging workflow deconvolutes and spatially resolves overlapping luminescence from diverse origins. For multiphase ceramics, CL imaging directly maps the distribution and functional state of the luminescent phase, revealing heterogeneity invisible to other techniques. This paper establishes SEM-CL as a powerful and adaptable tool for investigating a wide range of functional materials, providing critical insights that bridge the gap between microstructure and performance. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Materials Science is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 193142593
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Correlating morphology and luminescence with SEM-CL: versatile applications from dynamics to heterogeneity.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%22">Journal of Materials Science</searchLink>. May2026, Vol. 61 Issue 20, p14074-14085. 12p.
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  Data: <searchLink fieldCode="DE" term="%22Scanning+electron+microscopes%22">Scanning electron microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Cathodoluminescence%22">Cathodoluminescence</searchLink><br /><searchLink fieldCode="DE" term="%22Ceramics%22">Ceramics</searchLink><br /><searchLink fieldCode="DE" term="%22Perovskite%22">Perovskite</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductor+materials%22">Semiconductor materials</searchLink><br /><searchLink fieldCode="DE" term="%22Optoelectronics%22">Optoelectronics</searchLink><br /><searchLink fieldCode="DE" term="%22Hyperspectral+imaging+systems%22">Hyperspectral imaging systems</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+morphology%22">Surface morphology</searchLink>
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  Label: Abstract
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  Data: Scanning electron microscope–cathodoluminescence (SEM-CL) integrates high-resolution morphology imaging with localized spectral analysis, offering a unique platform for correlating material structure with optoelectronic function. This work demonstrates the versatility of this correlative approach across distinct material systems. For unstable halide perovskites, in situ CL visualizes rapid degradation dynamics prior to morphological change. In complex AlN/AlGaN semiconductors, a hyperspectral imaging workflow deconvolutes and spatially resolves overlapping luminescence from diverse origins. For multiphase ceramics, CL imaging directly maps the distribution and functional state of the luminescent phase, revealing heterogeneity invisible to other techniques. This paper establishes SEM-CL as a powerful and adaptable tool for investigating a wide range of functional materials, providing critical insights that bridge the gap between microstructure and performance. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Journal of Materials Science is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s10853-026-12652-9
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      – Code: eng
        Text: English
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        PageCount: 12
        StartPage: 14074
    Subjects:
      – SubjectFull: Scanning electron microscopes
        Type: general
      – SubjectFull: Cathodoluminescence
        Type: general
      – SubjectFull: Ceramics
        Type: general
      – SubjectFull: Perovskite
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      – SubjectFull: Semiconductor materials
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      – SubjectFull: Optoelectronics
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      – SubjectFull: Hyperspectral imaging systems
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      – SubjectFull: Surface morphology
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      – TitleFull: Correlating morphology and luminescence with SEM-CL: versatile applications from dynamics to heterogeneity.
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            NameFull: Jiang, Rongrong
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            NameFull: Hu, Kejia
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            NameFull: Yao, Yirong
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            NameFull: Li, Ming
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              M: 05
              Text: May2026
              Type: published
              Y: 2026
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