Correlating morphology and luminescence with SEM-CL: versatile applications from dynamics to heterogeneity.
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| Title: | Correlating morphology and luminescence with SEM-CL: versatile applications from dynamics to heterogeneity. |
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| Authors: | Jiang, Rongrong1 (AUTHOR) jiangrr@nimte.ac.cn, Hu, Kejia2 (AUTHOR), Yao, Yirong1 (AUTHOR), Li, Ming1 (AUTHOR), Ke, Peiling1 (AUTHOR) |
| Source: | Journal of Materials Science. May2026, Vol. 61 Issue 20, p14074-14085. 12p. |
| Subjects: | Scanning electron microscopes, Cathodoluminescence, Ceramics, Perovskite, Semiconductor materials, Optoelectronics, Hyperspectral imaging systems, Surface morphology |
| Abstract: | Scanning electron microscope–cathodoluminescence (SEM-CL) integrates high-resolution morphology imaging with localized spectral analysis, offering a unique platform for correlating material structure with optoelectronic function. This work demonstrates the versatility of this correlative approach across distinct material systems. For unstable halide perovskites, in situ CL visualizes rapid degradation dynamics prior to morphological change. In complex AlN/AlGaN semiconductors, a hyperspectral imaging workflow deconvolutes and spatially resolves overlapping luminescence from diverse origins. For multiphase ceramics, CL imaging directly maps the distribution and functional state of the luminescent phase, revealing heterogeneity invisible to other techniques. This paper establishes SEM-CL as a powerful and adaptable tool for investigating a wide range of functional materials, providing critical insights that bridge the gap between microstructure and performance. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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