Mitigating fabrication variations in silicon ring resonators: theoretical and statistical comparison of all-pass ring and add-drop racetrack designs.
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| Title: | Mitigating fabrication variations in silicon ring resonators: theoretical and statistical comparison of all-pass ring and add-drop racetrack designs. |
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| Authors: | Abdelhady, Ahmed1 (AUTHOR) ahmedamrabdelhady@gmail.com, Fathy, Alaa1 (AUTHOR), Khalil, Diaa1 (AUTHOR) |
| Source: | Optical & Quantum Electronics. Apr2026, Vol. 58 Issue 4, p1-20. 20p. |
| Subjects: | Optical resonators, Manufacturing defects, Integrated optics, Photonics, Resonators, Optical communications, Statistics |
| Abstract: | Ring resonators are pivotal components in silicon photonics, serving as essential building blocks for modulators, demultiplexers, filters, and sensors in high-speed optical communication and integrated photonic systems. Their compact size, wavelength selectivity, and compatibility with CMOS manufacturing make them indispensable for applications like wavelength-division multiplexing and optical interconnects. However, their performance is highly sensitive to process variations, particularly in the coupling region, where even nanometer-scale fabrication imperfections can significantly degrade key metrics like the quality factor, posing a critical bottleneck for reliable, high-volume production. This study proposes a method to mitigate performance variation caused by manufacturing imperfections in coupling regions. Racetrack designs with certain gaps and certain physical coupling lengths are shown prospectively to better manage variations, improving stability compared to standard all-pass rings, as validated by simulations and statistical analysis. The findings offer practical guidelines for designing more reliable photonic devices. [ABSTRACT FROM AUTHOR] |
| Copyright of Optical & Quantum Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 193198649 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11082-026-08733-3 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 20 StartPage: 1 Subjects: – SubjectFull: Optical resonators Type: general – SubjectFull: Manufacturing defects Type: general – SubjectFull: Integrated optics Type: general – SubjectFull: Photonics Type: general – SubjectFull: Resonators Type: general – SubjectFull: Optical communications Type: general – SubjectFull: Statistics Type: general Titles: – TitleFull: Mitigating fabrication variations in silicon ring resonators: theoretical and statistical comparison of all-pass ring and add-drop racetrack designs. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Abdelhady, Ahmed – PersonEntity: Name: NameFull: Fathy, Alaa – PersonEntity: Name: NameFull: Khalil, Diaa IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 04 Text: Apr2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 03068919 Numbering: – Type: volume Value: 58 – Type: issue Value: 4 Titles: – TitleFull: Optical & Quantum Electronics Type: main |
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