High Q-Factor Permittivity Sensor with Dual-Band and Independent Performance for Solid Material Characterization.
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| Title: | High Q-Factor Permittivity Sensor with Dual-Band and Independent Performance for Solid Material Characterization. |
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| Authors: | Asrar, Leni D.1,2, Zakaria, Zahriladha1 zahriladha@utem.edu.my, Alam, Syah3, Setyadi, Iwan4, Meor Said, Maizatul A.1 |
| Source: | Progress in Electromagnetics Research C. 2026, Vol. 168, p104-116. 13p. |
| Subjects: | Permittivity measurement, Resonators, Detectors, Materials testing, Dielectric properties |
| Abstract: | This study proposes a two-port dual-band microwave sensor designed for the independent and simultaneous detection of solid material characteristics. The sensor consists of a pair of non-identical rectangle-shaped resonators arranged symmetrically, with two distinct sensing areas connected by a power divider and a microstrip feed line with an impedance of 50 Ohms. It operates at resonant frequencies of fr1 = 2.16 GHz and fr2 = 4.03 GHz, utilizing a Rogers 5880 substrate with εr = 2.2, tan δ = 0.0009, and a thickness of 0.79 mm. The tested materials include RO5880, RO4350, and FR4, with dimensions of 16 mm × 5 mm on the first resonator and 5 mm × 5 mm on the second resonator. The rectangular resonators successfully detect and measure the dielectric properties of solid materials while maintaining independent operation, ensuring that MUT loading does not interfere with each resonator. The measurement results indicate that fr1 and fr2 achieve average accuracies of 90.51% and 95.16%, respectively, for a permittivity range of 1-4.4, while the average normalized sensitivities are 2.42% and 1.36%. In addition, the Q-factors of resonators are 308 and 537, respectively. The proposed microwave sensor offers a promising solution for accurately detecting different characteristics of solid materials independently and simultaneously, with potential applications in the food industry, material quality control, and biomedical fields. [ABSTRACT FROM AUTHOR] |
| Copyright of Progress in Electromagnetics Research C is the property of Electromagnetics Academy and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 193303494 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: High Q-Factor Permittivity Sensor with Dual-Band and Independent Performance for Solid Material Characterization. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Asrar%2C+Leni+D%2E%22">Asrar, Leni D.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AR" term="%22Zakaria%2C+Zahriladha%22">Zakaria, Zahriladha</searchLink><relatesTo>1</relatesTo><i> zahriladha@utem.edu.my</i><br /><searchLink fieldCode="AR" term="%22Alam%2C+Syah%22">Alam, Syah</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Setyadi%2C+Iwan%22">Setyadi, Iwan</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AR" term="%22Meor+Said%2C+Maizatul+A%2E%22">Meor Said, Maizatul A.</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Progress+in+Electromagnetics+Research+C%22">Progress in Electromagnetics Research C</searchLink>. 2026, Vol. 168, p104-116. 13p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Permittivity+measurement%22">Permittivity measurement</searchLink><br /><searchLink fieldCode="DE" term="%22Resonators%22">Resonators</searchLink><br /><searchLink fieldCode="DE" term="%22Detectors%22">Detectors</searchLink><br /><searchLink fieldCode="DE" term="%22Materials+testing%22">Materials testing</searchLink><br /><searchLink fieldCode="DE" term="%22Dielectric+properties%22">Dielectric properties</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: This study proposes a two-port dual-band microwave sensor designed for the independent and simultaneous detection of solid material characteristics. The sensor consists of a pair of non-identical rectangle-shaped resonators arranged symmetrically, with two distinct sensing areas connected by a power divider and a microstrip feed line with an impedance of 50 Ohms. It operates at resonant frequencies of fr1 = 2.16 GHz and fr2 = 4.03 GHz, utilizing a Rogers 5880 substrate with εr = 2.2, tan δ = 0.0009, and a thickness of 0.79 mm. The tested materials include RO5880, RO4350, and FR4, with dimensions of 16 mm × 5 mm on the first resonator and 5 mm × 5 mm on the second resonator. The rectangular resonators successfully detect and measure the dielectric properties of solid materials while maintaining independent operation, ensuring that MUT loading does not interfere with each resonator. The measurement results indicate that fr1 and fr2 achieve average accuracies of 90.51% and 95.16%, respectively, for a permittivity range of 1-4.4, while the average normalized sensitivities are 2.42% and 1.36%. In addition, the Q-factors of resonators are 308 and 537, respectively. The proposed microwave sensor offers a promising solution for accurately detecting different characteristics of solid materials independently and simultaneously, with potential applications in the food industry, material quality control, and biomedical fields. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Progress in Electromagnetics Research C is the property of Electromagnetics Academy and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.2528/PIERC25090501 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 104 Subjects: – SubjectFull: Permittivity measurement Type: general – SubjectFull: Resonators Type: general – SubjectFull: Detectors Type: general – SubjectFull: Materials testing Type: general – SubjectFull: Dielectric properties Type: general Titles: – TitleFull: High Q-Factor Permittivity Sensor with Dual-Band and Independent Performance for Solid Material Characterization. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Asrar, Leni D. – PersonEntity: Name: NameFull: Zakaria, Zahriladha – PersonEntity: Name: NameFull: Alam, Syah – PersonEntity: Name: NameFull: Setyadi, Iwan – PersonEntity: Name: NameFull: Meor Said, Maizatul A. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: 2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 19378718 Numbering: – Type: volume Value: 168 Titles: – TitleFull: Progress in Electromagnetics Research C Type: main |
| ResultId | 1 |
