APA (7th ed.) Citation

Zeng, Q., Gong, Z., Guan, K., Li, Q., & Liu, J. (2026). Dynamic Amorphization and Potential Recovery Mechanisms in Silicon Carbide Fatigue: Atomic‐Scale Insights Across Single‐Crystal to Polycrystalline Structures. Fatigue & Fracture of Engineering Materials & Structures, 49(6), 2217. https://doi.org/10.1111/ffe.70256

Chicago Style (17th ed.) Citation

Zeng, Qingfeng, Zhenyuan Gong, Kang Guan, Qiuyan Li, and Jiantao Liu. "Dynamic Amorphization and Potential Recovery Mechanisms in Silicon Carbide Fatigue: Atomic‐Scale Insights Across Single‐Crystal to Polycrystalline Structures." Fatigue & Fracture of Engineering Materials & Structures 49, no. 6 (2026): 2217. https://doi.org/10.1111/ffe.70256.

MLA (9th ed.) Citation

Zeng, Qingfeng, et al. "Dynamic Amorphization and Potential Recovery Mechanisms in Silicon Carbide Fatigue: Atomic‐Scale Insights Across Single‐Crystal to Polycrystalline Structures." Fatigue & Fracture of Engineering Materials & Structures, vol. 49, no. 6, 2026, p. 2217, https://doi.org/10.1111/ffe.70256.