Fourteen‐analyser high‐resolution hard X‐ray emission spectrometer at I20 beamline at Diamond Light Source.
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| Title: | Fourteen‐analyser high‐resolution hard X‐ray emission spectrometer at I20 beamline at Diamond Light Source. |
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| Authors: | Hayama, Shusaku1 (AUTHOR) shusaku.hayama@diamond.ac.uk, Butler, David1 (AUTHOR), Cahill, Leo1 (AUTHOR), Mosselmans, J. Frederick W.1 (AUTHOR), Richards, Steven2 (AUTHOR), Ramos, Silvia2 (AUTHOR), Hall, Iain1 (AUTHOR), Shorthouse, Huw1 (AUTHOR), Diaz-Moreno, Sofia1 (AUTHOR) |
| Source: | Journal of Synchrotron Radiation. May2026, Vol. 33 Issue 3, p848-857. 10p. |
| Subjects: | X-ray spectrometers, X-ray emission spectroscopy, High resolution spectroscopy, X-ray spectroscopy, Time-resolved measurements |
| Abstract: | We report the technical design, implementation and operation of a newly developed X‐ray emission spectrometer on the I20 beamline at Diamond Light Source. The spectrometer consists of 14 crystal analysers arranged in an up–down configuration, allowing for operation in one‐ or two‐colour acquisition modes. Since beginning operations in 2023, the spectrometer has substantially enhanced the capability of the beamline to perform X‐ray emission spectroscopy (XES) and has demonstrated high reliability with minimal operational issues during user experiments. The latter achievement is particularly significant given the complexity of the instrument, and the difficulty of maintaining the Rowland condition when scanning the energy. We show that the spectrometer can effectively measure spectra in two‐colour mode and is capable of detecting weak valence‐to‐core emission features with a significantly improved signal‐to‐background ratio. We also present data taken using a newly developed quick‐scanning XES acquisition mode, which enables data collection in seconds rather than minutes. This mode opens up possibilities for time‐resolved studies and investigating radiation‐sensitive materials. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 193520499 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Fourteen‐analyser high‐resolution hard X‐ray emission spectrometer at I20 beamline at Diamond Light Source. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Hayama%2C+Shusaku%22">Hayama, Shusaku</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> shusaku.hayama@diamond.ac.uk</i><br /><searchLink fieldCode="AR" term="%22Butler%2C+David%22">Butler, David</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Cahill%2C+Leo%22">Cahill, Leo</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Mosselmans%2C+J%2E+Frederick+W%2E%22">Mosselmans, J. Frederick W.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Richards%2C+Steven%22">Richards, Steven</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ramos%2C+Silvia%22">Ramos, Silvia</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Hall%2C+Iain%22">Hall, Iain</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Shorthouse%2C+Huw%22">Shorthouse, Huw</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Diaz-Moreno%2C+Sofia%22">Diaz-Moreno, Sofia</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. May2026, Vol. 33 Issue 3, p848-857. 10p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22X-ray+spectrometers%22">X-ray spectrometers</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+emission+spectroscopy%22">X-ray emission spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22High+resolution+spectroscopy%22">High resolution spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+spectroscopy%22">X-ray spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Time-resolved+measurements%22">Time-resolved measurements</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: We report the technical design, implementation and operation of a newly developed X‐ray emission spectrometer on the I20 beamline at Diamond Light Source. The spectrometer consists of 14 crystal analysers arranged in an up–down configuration, allowing for operation in one‐ or two‐colour acquisition modes. Since beginning operations in 2023, the spectrometer has substantially enhanced the capability of the beamline to perform X‐ray emission spectroscopy (XES) and has demonstrated high reliability with minimal operational issues during user experiments. The latter achievement is particularly significant given the complexity of the instrument, and the difficulty of maintaining the Rowland condition when scanning the energy. We show that the spectrometer can effectively measure spectra in two‐colour mode and is capable of detecting weak valence‐to‐core emission features with a significantly improved signal‐to‐background ratio. We also present data taken using a newly developed quick‐scanning XES acquisition mode, which enables data collection in seconds rather than minutes. This mode opens up possibilities for time‐resolved studies and investigating radiation‐sensitive materials. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1107/S1600577526001736 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 848 Subjects: – SubjectFull: X-ray spectrometers Type: general – SubjectFull: X-ray emission spectroscopy Type: general – SubjectFull: High resolution spectroscopy Type: general – SubjectFull: X-ray spectroscopy Type: general – SubjectFull: Time-resolved measurements Type: general Titles: – TitleFull: Fourteen‐analyser high‐resolution hard X‐ray emission spectrometer at I20 beamline at Diamond Light Source. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Hayama, Shusaku – PersonEntity: Name: NameFull: Butler, David – PersonEntity: Name: NameFull: Cahill, Leo – PersonEntity: Name: NameFull: Mosselmans, J. Frederick W. – PersonEntity: Name: NameFull: Richards, Steven – PersonEntity: Name: NameFull: Ramos, Silvia – PersonEntity: Name: NameFull: Hall, Iain – PersonEntity: Name: NameFull: Shorthouse, Huw – PersonEntity: Name: NameFull: Diaz-Moreno, Sofia IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 09090495 Numbering: – Type: volume Value: 33 – Type: issue Value: 3 Titles: – TitleFull: Journal of Synchrotron Radiation Type: main |
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