APA (7th ed.) Citation

Yoshinaga, K., O'Neal, J. T., Sakurai, K., Egawa, S., Furuya, N., Shimamura, T., . . . Kimura, T. (2026). Total‐reflection‐based microscope compatible with X‐ray and visible light for sample positioning. Journal of Synchrotron Radiation, 33(3), 604. https://doi.org/10.1107/S1600577526003127

Chicago Style (17th ed.) Citation

Yoshinaga, Kyota, et al. "Total‐reflection‐based Microscope Compatible with X‐ray and Visible Light for Sample Positioning." Journal of Synchrotron Radiation 33, no. 3 (2026): 604. https://doi.org/10.1107/S1600577526003127.

MLA (9th ed.) Citation

Yoshinaga, Kyota, et al. "Total‐reflection‐based Microscope Compatible with X‐ray and Visible Light for Sample Positioning." Journal of Synchrotron Radiation, vol. 33, no. 3, 2026, p. 604, https://doi.org/10.1107/S1600577526003127.