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Total‐reflection‐based microscope compatible with X‐ray and visible light for sample positioning.

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Title: Total‐reflection‐based microscope compatible with X‐ray and visible light for sample positioning.
Authors: Yoshinaga, Kyota1,2,3 (AUTHOR) yoshinaga@issp.u-tokyo.ac.jp, O'Neal, Jordan Tyler1,2 (AUTHOR) oneal@anl.gov, Sakurai, Kai1,2,3 (AUTHOR), Egawa, Satoru4 (AUTHOR), Furuya, Noboru1 (AUTHOR), Shimamura, Takenori1,2,3 (AUTHOR), Takeo, Yoko1,2 (AUTHOR), Nakata, Yu1,2 (AUTHOR), Nagayama, Yuichi1 (AUTHOR), Kishimoto, Hikaru3 (AUTHOR), Senba, Yasunori2,3 (AUTHOR), Shimura, Mari2,5 (AUTHOR), Kodama, Taketoshi6 (AUTHOR), Yabashi, Makina2,3 (AUTHOR), Ohashi, Haruhiko2,3 (AUTHOR), Kimura, Takashi1,2 (AUTHOR) tkimura@issp.u-tokyo.ac.jp
Source: Journal of Synchrotron Radiation. May2026, Vol. 33 Issue 3, p604-608. 5p.
Subjects: X-ray microscopy, Calibration, Microscopes, Mirrors, Total internal reflection (Optics), X-ray imaging, Biological specimens
Abstract: Sample positioning in X‐ray imaging is often technically demanding and involves radiation exposure to the sample. For easier and damage‐free positioning, the integration of a visible‐light microscope is an effective and widely adopted approach. However, such visible‐light microscopes require careful calibration of the objective optic against the X‐ray microscope, which introduces additional challenges. To address this issue, we propose a simple total‐reflection‐based microscope compatible with X‐rays and visible light using a Wolter mirror which functions as both X‐ray condenser optic and visible‐light objective optic. Calibrating our visible‐light microscope requires only simple adjustment of an optical lens and three planar mirrors, while no adjustment of the objective optic. We constructed our proposed system for a soft X‐ray ptychography system and successfully demonstrated the simple calibration of the visible‐light microscope, which was then applied to position a biological sample without delivering a radiation dose. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Total‐reflection‐based microscope compatible with X‐ray and visible light for sample positioning.
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  Data: <searchLink fieldCode="AR" term="%22Yoshinaga%2C+Kyota%22">Yoshinaga, Kyota</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<i> yoshinaga@issp.u-tokyo.ac.jp</i><br /><searchLink fieldCode="AR" term="%22O'Neal%2C+Jordan+Tyler%22">O'Neal, Jordan Tyler</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> oneal@anl.gov</i><br /><searchLink fieldCode="AR" term="%22Sakurai%2C+Kai%22">Sakurai, Kai</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Egawa%2C+Satoru%22">Egawa, Satoru</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Furuya%2C+Noboru%22">Furuya, Noboru</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Shimamura%2C+Takenori%22">Shimamura, Takenori</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Takeo%2C+Yoko%22">Takeo, Yoko</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nakata%2C+Yu%22">Nakata, Yu</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nagayama%2C+Yuichi%22">Nagayama, Yuichi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kishimoto%2C+Hikaru%22">Kishimoto, Hikaru</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Senba%2C+Yasunori%22">Senba, Yasunori</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Shimura%2C+Mari%22">Shimura, Mari</searchLink><relatesTo>2,5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kodama%2C+Taketoshi%22">Kodama, Taketoshi</searchLink><relatesTo>6</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yabashi%2C+Makina%22">Yabashi, Makina</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ohashi%2C+Haruhiko%22">Ohashi, Haruhiko</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kimura%2C+Takashi%22">Kimura, Takashi</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> tkimura@issp.u-tokyo.ac.jp</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. May2026, Vol. 33 Issue 3, p604-608. 5p.
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– Name: Abstract
  Label: Abstract
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  Data: Sample positioning in X‐ray imaging is often technically demanding and involves radiation exposure to the sample. For easier and damage‐free positioning, the integration of a visible‐light microscope is an effective and widely adopted approach. However, such visible‐light microscopes require careful calibration of the objective optic against the X‐ray microscope, which introduces additional challenges. To address this issue, we propose a simple total‐reflection‐based microscope compatible with X‐rays and visible light using a Wolter mirror which functions as both X‐ray condenser optic and visible‐light objective optic. Calibrating our visible‐light microscope requires only simple adjustment of an optical lens and three planar mirrors, while no adjustment of the objective optic. We constructed our proposed system for a soft X‐ray ptychography system and successfully demonstrated the simple calibration of the visible‐light microscope, which was then applied to position a biological sample without delivering a radiation dose. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1107/S1600577526003127
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        Text: English
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        PageCount: 5
        StartPage: 604
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      – SubjectFull: X-ray microscopy
        Type: general
      – SubjectFull: Calibration
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      – SubjectFull: Microscopes
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      – SubjectFull: Mirrors
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      – SubjectFull: Total internal reflection (Optics)
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      – SubjectFull: X-ray imaging
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      – SubjectFull: Biological specimens
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      – TitleFull: Total‐reflection‐based microscope compatible with X‐ray and visible light for sample positioning.
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