Qiao, Y., & Zhang, Y. (2026). Recent Advances in FIB-SEM for Microstructural Characterization of Metallic Materials. Materials (1996-1944), 19(9), 1818. https://doi.org/10.3390/ma19091818
Chicago Style (17th ed.) CitationQiao, Yi, and Yong Zhang. "Recent Advances in FIB-SEM for Microstructural Characterization of Metallic Materials." Materials (1996-1944) 19, no. 9 (2026): 1818. https://doi.org/10.3390/ma19091818.
MLA (9th ed.) CitationQiao, Yi, and Yong Zhang. "Recent Advances in FIB-SEM for Microstructural Characterization of Metallic Materials." Materials (1996-1944), vol. 19, no. 9, 2026, p. 1818, https://doi.org/10.3390/ma19091818.
Warning: These citations may not always be 100% accurate.