Reboud, C., & Skarlatos, A. (2026). Semi-analytical simulation of eddy current testing inspections by means of convergent Born series. International Journal of Applied Electromagnetics & Mechanics, 80(5/6), 233. https://doi.org/10.1177/13835416261430101
Chicago Style (17th ed.) CitationReboud, Christophe, and Anastassios Skarlatos. "Semi-analytical Simulation of Eddy Current Testing Inspections by Means of Convergent Born Series." International Journal of Applied Electromagnetics & Mechanics 80, no. 5/6 (2026): 233. https://doi.org/10.1177/13835416261430101.
MLA (9th ed.) CitationReboud, Christophe, and Anastassios Skarlatos. "Semi-analytical Simulation of Eddy Current Testing Inspections by Means of Convergent Born Series." International Journal of Applied Electromagnetics & Mechanics, vol. 80, no. 5/6, 2026, p. 233, https://doi.org/10.1177/13835416261430101.