APA (7th ed.) Citation

Lang, S. J. K., Eisele, I., Weber, J., Schewski, A., Music, E., Maiwald, A., . . . Kutter, C. (2026). Wafer-Scale Electrical Characterization of Al/Al x O y /Al Tunnel Junctions for Process Monitoring at Room Temperature. Nanomaterials (2079-4991), 16(10), 569. https://doi.org/10.3390/nano16100569

Chicago Style (17th ed.) Citation

Lang, Simon Johann Klaus, et al. "Wafer-Scale Electrical Characterization of Al/Al X O Y /Al Tunnel Junctions for Process Monitoring at Room Temperature." Nanomaterials (2079-4991) 16, no. 10 (2026): 569. https://doi.org/10.3390/nano16100569.

MLA (9th ed.) Citation

Lang, Simon Johann Klaus, et al. "Wafer-Scale Electrical Characterization of Al/Al X O Y /Al Tunnel Junctions for Process Monitoring at Room Temperature." Nanomaterials (2079-4991), vol. 16, no. 10, 2026, p. 569, https://doi.org/10.3390/nano16100569.