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SH-wave diffraction from the thin impedance-type defect in the rigid joint of interface and elastic layer.

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Title: SH-wave diffraction from the thin impedance-type defect in the rigid joint of interface and elastic layer.
Authors: Kuryliak, Dozyslav B.1 (AUTHOR) kuryliak@pancha.lviv.ua, Nazarchuk, Zinoviy T.1 (AUTHOR) zinoviy.nazarchuk@gmail.com, Voytko, Myron V.1 (AUTHOR) myron.voytko@gmail.com, Kulynych, Yaroslav P.1 (AUTHOR) yar.kulynych@gmail.com
Source: Zeitschrift für Angewandte Mathematik und Physik (ZAMP). May2026, Vol. 77 Issue 5, p1-27. 27p.
Subjects: Wave diffraction, Rectangular waveguides, Spectral theory
Abstract: The problem of an elastic SH-wave diffraction from a thin finite defect formed on a flat interface between a rigidly joined homogeneous elastic layer and an interface is analyzed. The interface damage is modelled by an impedance strip. The joint is considered a series-connected semi-infinite and finite planar elastic waveguides excited by the normal SH-mode. The problem is reduced to an infinite system of linear algebraic equations of the second kind using the Wiener–Hopf technique. Based on its solution, the dependencies of the displacement field distribution on the stress-free surface of the elastic layer regarding the geometrical and physical parameters are investigated. The spectral properties of an open resonator formed by the rectangular waveguide's defect area are studied. This study focuses on the physical features of the displacement field and its frequency dependencies as markers for detecting defects and their parameters. [ABSTRACT FROM AUTHOR]
Copyright of Zeitschrift für Angewandte Mathematik und Physik (ZAMP) is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
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  Data: SH-wave diffraction from the thin impedance-type defect in the rigid joint of interface and elastic layer.
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  Label: Abstract
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  Data: The problem of an elastic SH-wave diffraction from a thin finite defect formed on a flat interface between a rigidly joined homogeneous elastic layer and an interface is analyzed. The interface damage is modelled by an impedance strip. The joint is considered a series-connected semi-infinite and finite planar elastic waveguides excited by the normal SH-mode. The problem is reduced to an infinite system of linear algebraic equations of the second kind using the Wiener–Hopf technique. Based on its solution, the dependencies of the displacement field distribution on the stress-free surface of the elastic layer regarding the geometrical and physical parameters are investigated. The spectral properties of an open resonator formed by the rectangular waveguide's defect area are studied. This study focuses on the physical features of the displacement field and its frequency dependencies as markers for detecting defects and their parameters. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
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  Data: <i>Copyright of Zeitschrift für Angewandte Mathematik und Physik (ZAMP) is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s00033-026-02792-y
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        Text: English
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        Type: general
      – SubjectFull: Rectangular waveguides
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      – SubjectFull: Spectral theory
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              M: 05
              Text: May2026
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              Y: 2026
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