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Automated serial electron diffraction: implementation in LibraEDT and its applications.

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Title: Automated serial electron diffraction: implementation in LibraEDT and its applications.
Authors: Faye Diouf, Moussa D.1,2 (AUTHOR) moussa.faye@iit.it, Marchetti, Danilo2 (AUTHOR), Parlanti, Paola1 (AUTHOR), Pedrini, Alessandro2 (AUTHOR), Gemmi, Mauro1 (AUTHOR)
Source: Journal of Applied Crystallography. Jun2026, Vol. 59 Issue 3, p858-868. 11p.
Subjects: Electron diffraction, Data acquisition systems, Condensed matter, Computer software, Scientific computing
Abstract: Serial electron diffraction (SerialED) offers an effective route for structure determination of beam‐sensitive materials, yet its adoption has been limited by the practical challenges of manual acquisition and the handling of large datasets. In this work, we introduce the implementation of continuous SerialED, also known as stage‐scanning SerialED, within LibraEDT for unsupervised data collection. To illustrate its practicality, SerialED datasets were collected with and without precession and later processed with minimal additional effort, showing that the acquisition strategy is compatible with standard data processing tools. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 194204569
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Crystallography%22">Journal of Applied Crystallography</searchLink>. Jun2026, Vol. 59 Issue 3, p858-868. 11p.
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  Data: <searchLink fieldCode="DE" term="%22Electron+diffraction%22">Electron diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Data+acquisition+systems%22">Data acquisition systems</searchLink><br /><searchLink fieldCode="DE" term="%22Condensed+matter%22">Condensed matter</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+software%22">Computer software</searchLink><br /><searchLink fieldCode="DE" term="%22Scientific+computing%22">Scientific computing</searchLink>
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  Data: Serial electron diffraction (SerialED) offers an effective route for structure determination of beam‐sensitive materials, yet its adoption has been limited by the practical challenges of manual acquisition and the handling of large datasets. In this work, we introduce the implementation of continuous SerialED, also known as stage‐scanning SerialED, within LibraEDT for unsupervised data collection. To illustrate its practicality, SerialED datasets were collected with and without precession and later processed with minimal additional effort, showing that the acquisition strategy is compatible with standard data processing tools. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1107/S1600576726003894
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      – Code: eng
        Text: English
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        PageCount: 11
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      – SubjectFull: Data acquisition systems
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      – SubjectFull: Condensed matter
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              M: 06
              Text: Jun2026
              Type: published
              Y: 2026
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