APA (7th ed.) Citation

Milazzo, S., Greco, G., Giorgino, G., Miccoli, C., Mirabella, S., Iucolano, F., & Roccaforte, F. (2026). Modelling the ON-state gate leakage current in p-GaN gated AlGaN/GaN HEMTs. Microelectronic Engineering, 305, N.PAG. https://doi.org/10.1016/j.mee.2026.112469

Chicago Style (17th ed.) Citation

Milazzo, S., G. Greco, G. Giorgino, C. Miccoli, S. Mirabella, F. Iucolano, and F. Roccaforte. "Modelling the ON-state Gate Leakage Current in P-GaN Gated AlGaN/GaN HEMTs." Microelectronic Engineering 305 (2026): N.PAG. https://doi.org/10.1016/j.mee.2026.112469.

MLA (9th ed.) Citation

Milazzo, S., et al. "Modelling the ON-state Gate Leakage Current in P-GaN Gated AlGaN/GaN HEMTs." Microelectronic Engineering, vol. 305, 2026, p. N.PAG, https://doi.org/10.1016/j.mee.2026.112469.