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Nonlinear thermo-electromechanical interaction in piezoelectric semiconductor PN junction shell structures.

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Title: Nonlinear thermo-electromechanical interaction in piezoelectric semiconductor PN junction shell structures.
Authors: Wang, Tiqing1 (AUTHOR), Zhu, Feng2 (AUTHOR), Li, Peng1,3 (AUTHOR), Xu, Zelin1 (AUTHOR), Ma, Tingfeng4 (AUTHOR), Kuznetsova, Iren5 (AUTHOR), Qian, Zhenghua1,3 (AUTHOR) qianzh@nuaa.edu.cn
Source: Acta Mechanica. Jun2026, Vol. 237 Issue 6, p2955-2973. 19p.
Subjects: Current-voltage characteristics, Semiconductor junctions, Drift diffusion models, Piezoelectric thin films, Piezoelectricity
Abstract: Due to the coupling between piezoelectric and semiconducting effects, the piezoelectric semiconductor (PS) PN junction enables mechanical modulation of carrier transport. However, their current–voltage (I–V) characteristics in shell structures remain insufficiently explored under nonlinear multiphysical coupling. To address this issue, this study analyzes the multiphysics coupling behavior of PS PN junction thin-film structures and its influence on the I–V characteristics based on the nonlinear drift–diffusion (NLDD) model. The governing equations describing the nonlinear thermo-electromechanical interaction are derived using the principle of virtual work, charge conservation, and heat conduction. An iterative method combined with the generalized differential quadrature method (GDQM) is employed to solve the nonlinear system, and the accuracy is validated against finite element results. The results indicate that tensile loading can modulate the I–V characteristics of PS PN junction thin-film shells, showing an approximately linear trend within the considered loading range, whereas the influence of temperature appears relatively weak, which can be attributed to the competing effects of multiple temperature-dependent factors. These results may provide theoretical reference for the analysis and design of PS PN junction devices operating under complex multiphysical environments. [ABSTRACT FROM AUTHOR]
Copyright of Acta Mechanica is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
An: 194518019
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Nonlinear thermo-electromechanical interaction in piezoelectric semiconductor PN junction shell structures.
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  Data: <searchLink fieldCode="JN" term="%22Acta+Mechanica%22">Acta Mechanica</searchLink>. Jun2026, Vol. 237 Issue 6, p2955-2973. 19p.
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  Data: <searchLink fieldCode="DE" term="%22Current-voltage+characteristics%22">Current-voltage characteristics</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductor+junctions%22">Semiconductor junctions</searchLink><br /><searchLink fieldCode="DE" term="%22Drift+diffusion+models%22">Drift diffusion models</searchLink><br /><searchLink fieldCode="DE" term="%22Piezoelectric+thin+films%22">Piezoelectric thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Piezoelectricity%22">Piezoelectricity</searchLink>
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  Data: Due to the coupling between piezoelectric and semiconducting effects, the piezoelectric semiconductor (PS) PN junction enables mechanical modulation of carrier transport. However, their current–voltage (I–V) characteristics in shell structures remain insufficiently explored under nonlinear multiphysical coupling. To address this issue, this study analyzes the multiphysics coupling behavior of PS PN junction thin-film structures and its influence on the I–V characteristics based on the nonlinear drift–diffusion (NLDD) model. The governing equations describing the nonlinear thermo-electromechanical interaction are derived using the principle of virtual work, charge conservation, and heat conduction. An iterative method combined with the generalized differential quadrature method (GDQM) is employed to solve the nonlinear system, and the accuracy is validated against finite element results. The results indicate that tensile loading can modulate the I–V characteristics of PS PN junction thin-film shells, showing an approximately linear trend within the considered loading range, whereas the influence of temperature appears relatively weak, which can be attributed to the competing effects of multiple temperature-dependent factors. These results may provide theoretical reference for the analysis and design of PS PN junction devices operating under complex multiphysical environments. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Acta Mechanica is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Text: English
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      – SubjectFull: Drift diffusion models
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              Text: Jun2026
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              Y: 2026
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